-
1
-
-
0035947203
-
Elaboration, characterization and dielectric properties study of amorphous alumina thin films deposited by r.f. magnetron sputtering
-
Segda BG, Jacquet M, Besse JP (2001) Elaboration, characterization and dielectric properties study of amorphous alumina thin films deposited by r.f. magnetron sputtering. Vacuum 62:27–38
-
(2001)
Vacuum
, vol.62
, pp. 27-38
-
-
Segda, B.G.1
Jacquet, M.2
Besse, J.P.3
-
2
-
-
1142281032
-
3 thin films prepared by electron beam evaporation and spray pyrolysis method
-
3 thin films prepared by electron beam evaporation and spray pyrolysis method. Mater Sci Eng B 106:269–274
-
(2004)
Mater Sci Eng B
, vol.106
, pp. 269-274
-
-
Shamala, K.S.1
Murthy, L.C.S.2
Rao, K.N.3
-
5
-
-
84880293310
-
Preparation and dielectric properties of dense and amorphous alumina film by sol–gel technology
-
Hu BF, Yao MW, Yang PF, Shan W, Yao X (2013) Preparation and dielectric properties of dense and amorphous alumina film by sol–gel technology. Ceram Int 39:7613–7918
-
(2013)
Ceram Int
, vol.39
, pp. 7613-7918
-
-
Hu, B.F.1
Yao, M.W.2
Yang, P.F.3
Shan, W.4
Yao, X.5
-
6
-
-
84891751903
-
Preparation and breakdown property of aluminum oxide thin films deposited onto anodized aluminum substrate
-
Yao MW, Chen JW, Yang PF, Shan W, Hu BF, Yao X (2013) Preparation and breakdown property of aluminum oxide thin films deposited onto anodized aluminum substrate. Ferroelectrics 455:21–28
-
(2013)
Ferroelectrics
, vol.455
, pp. 21-28
-
-
Yao, M.W.1
Chen, J.W.2
Yang, P.F.3
Shan, W.4
Hu, B.F.5
Yao, X.6
-
8
-
-
0001189629
-
Effects of additive elements on electrical properties of tantalum oxide films
-
Fujikawa H, Taga Y (1994) Effects of additive elements on electrical properties of tantalum oxide films. J Appl Phys 75:2538–2544
-
(1994)
J Appl Phys
, vol.75
, pp. 2538-2544
-
-
Fujikawa, H.1
Taga, Y.2
-
9
-
-
0037439907
-
5 films formed by metalorganic decomposition
-
5 films formed by metalorganic decomposition. J Appl Phys 93:1169–1175
-
(2003)
J Appl Phys
, vol.93
, pp. 1169-1175
-
-
Salam, K.M.A.1
Fukuda, N.S.2
-
10
-
-
33947311074
-
Mechanism of leakage current reduction of tantalum oxide capacitors by titanium doping
-
Lau WS, Tan TS, Babu P, Sandler NP (2007) Mechanism of leakage current reduction of tantalum oxide capacitors by titanium doping. Appl Phys Lett 90:112903
-
(2007)
Appl Phys Lett
, vol.90
, pp. 112903
-
-
Lau, W.S.1
Tan, T.S.2
Babu, P.3
Sandler, N.P.4
-
11
-
-
77956565353
-
Resolving surface chemical states in XPS analysis of first row transition metals, oxides and hydroxides: Sc, Ti, V, Cu and Zn
-
Biesinger MC, Lau LWM, Gerson AR, Smart RSC (2010) Resolving surface chemical states in XPS analysis of first row transition metals, oxides and hydroxides: Sc, Ti, V, Cu and Zn. Appl Surf Sci 257:887–898
-
(2010)
Appl Surf Sci
, vol.257
, pp. 887-898
-
-
Biesinger, M.C.1
Lau, L.W.M.2
Gerson, A.R.3
Smart, R.S.C.4
-
13
-
-
0012588101
-
Studies on the surface chemistry of oxide films formed on IN-738LC superalloy at elevated temperatures in dry air
-
Seal S, Kuiry SC, Bracho LA (2001) Studies on the surface chemistry of oxide films formed on IN-738LC superalloy at elevated temperatures in dry air. Oxid Met 56:483–603
-
(2001)
Oxid Met
, vol.56
, pp. 483-603
-
-
Seal, S.1
Kuiry, S.C.2
Bracho, L.A.3
-
14
-
-
47049096034
-
2 films with ultralow leakage currents for next generation DRAM capacitors
-
2 films with ultralow leakage currents for next generation DRAM capacitors. Adv Mater 20:1429–1435
-
(2008)
Adv Mater
, vol.20
, pp. 1429-1435
-
-
Kim, S.K.1
Choi, G.-J.2
Lee, S.Y.3
Seo, M.4
Lee, S.W.5
Han, J.H.6
Ahn, H.-S.7
Han, S.8
Hwang, C.S.9
-
15
-
-
0032028576
-
Differentiation between electric breakdowns and dielectric breakdown in thin silicon oxides
-
Jackson JC, Robinson T, Oralkan O, Dumin DJ (1998) Differentiation between electric breakdowns and dielectric breakdown in thin silicon oxides. J Electrochem Soc 145:1033–1038
-
(1998)
J Electrochem Soc
, vol.145
, pp. 1033-1038
-
-
Jackson, J.C.1
Robinson, T.2
Oralkan, O.3
Dumin, D.J.4
-
16
-
-
33846197545
-
Thick alumina dielectric films on aluminium though chemically bonded composite sol–gel
-
Kim H, Troczynski T (2007) Thick alumina dielectric films on aluminium though chemically bonded composite sol–gel. Ceram Int 33:333–336
-
(2007)
Ceram Int
, vol.33
, pp. 333-336
-
-
Kim, H.1
Troczynski, T.2
-
18
-
-
77955221841
-
3
-
3. J Appl Phys 108:013501
-
(2010)
J Appl Phys
, vol.108
, pp. 013501
-
-
Perevalov, T.V.1
Tereshenko, O.E.2
Gritsenko, V.A.3
Pustovarov, V.A.4
Yelisseyev, A.P.5
Park, C.6
Han, J.H.7
Lee, C.8
|