Voltage-dependent dielectric breakdown and voltage-controlled negative resistance in anodized [formula omitted] diodes

Journal of Applied Physics

Volumn 88, Issue 5, 2000, Pages 2805-2812

  Hickmott, T W ^a  

^a STATE UNIVERSITY OF NEW YORK   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; ALUMINUM OXIDE; BINARY ALLOYS; DIODES; ELECTRIC BREAKDOWN; ELECTRIC CONTACTORS; ELECTRIC INSULATORS; ELECTROLYTES; METAL INSULATOR BOUNDARIES; NEGATIVE RESISTANCE; OHMIC CONTACTS;

APPLIED VOLTAGES; INSULATING FILM; IV CHARACTERISTICS; LARGE CURRENT; METAL INSULATOR INTERFACES; VOLTAGE-CONTROLLED;

ELECTRON EMISSION;

EID: 0000432842     PISSN: 00218979     EISSN: 10897550     Source Type: Journal    
DOI: 10.1063/1.1287116     Document Type: Article

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