In situ transmission electron microscopy imaging of grain growth in a platinum nanobridge induced by electric current annealing

Nanotechnology

Volumn 22, Issue 20, 2011, Pages

  Gao, B ^a,c   Rudneva, M ^a   McGarrity, K S ^a,b   Xu, Q ^a   Prins, F ^a   Thijssen, J M ^a   Zandbergen, H ^a   Van Der Zant, H S J ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^c MAX PLANCK INSTITUT FÜR FESTKÖRPERFORSCHUNG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT ANNEALING; DIFFERENTIAL RESISTANCES; ELECTRICAL CHARACTERIZATION; GRAIN BOUNDARY SCATTERING; IN-SITU TRANSMISSION; NANO SCALE; NANOBRIDGE; REAL TIME; TEM; THERMALLY INDUCED;

ELECTRIC CURRENT MEASUREMENT; ELECTRIC POWER SUPPLIES TO APPARATUS; GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; IN SITU PROCESSING; PLATINUM; TRANSMISSION ELECTRON MICROSCOPY;

GRAIN GROWTH;

EID: 79953276383     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/22/20/205705     Document Type: Article

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