Characterizing the metal-SAM interface in tunneling junctions

ACS Nano

Volumn 9, Issue 2, 2015, Pages 1471-1477

  Bowers, Carleen M ^a   Liao, Kung Ching ^a   Zaba, Tomasz ^b   Rappoport, Dmitrij ^a   Baghbanzadeh, Mostafa ^a   Breiten, Benjamin ^a   Krzykawska, Anna ^b   Cyganik, Piotr ^b   Whitesides, George M ^a,c  

^a HARVARD UNIVERSITY   (United States)

^b JAGIELLONIAN UNIVERSITY   (Poland)

^c HARVARD UNIVERSITY   (United States)

Author keywords

alkynes; charge transport; EGaIn; molecular electronics; self assembled monolayer

Indexed keywords

CARRIER TRANSPORT; CHARGE TRANSFER; ELECTRONIC PROPERTIES; MOLECULAR ELECTRONICS; SELF ASSEMBLED MONOLAYERS;

ALKYNES; ANCHORING GROUPS; EGAIN; INJECTION CURRENTS; MEASUREMENTS OF; SILVER METAL; TUNNELING BARRIER; TUNNELING JUNCTIONS;

ELECTRODES;

EID: 84923473094     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/nn5059216     Document Type: Article

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