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Volumn 571, Issue P3, 2014, Pages 756-761
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Characterization of μc-Si:H/a-Si:H tandem solar cell structures by spectroscopic ellipsometry
a
GIFU UNIVERSITY
(Japan)
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Author keywords
a Si:H; Solar cell; Spectroscopic ellipsometry; Tandem structure; ZnO; c Si:H
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Indexed keywords
AMORPHOUS SILICON;
FILM PREPARATION;
HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;
II-VI SEMICONDUCTORS;
MICROCRYSTALS;
MULTILAYERS;
OPTICAL MULTILAYERS;
OXIDE MINERALS;
SOLAR CELLS;
SPECTROSCOPIC ANALYSIS;
SPECTROSCOPIC ELLIPSOMETRY;
SUBSTRATES;
TEXTURES;
THIN FILM SOLAR CELLS;
ZINC OXIDE;
A-SI:H;
HYDROGENATED AMORPHOUS SILICON (A-SI:H);
MULTILAYER STRUCTURES;
SOLAR CELL STRUCTURES;
STRUCTURAL CHARACTERIZATION;
SUBSTRATE STRUCTURE;
TANDEM STRUCTURE;
TWO PHASE COMPOSITES;
SILICON SOLAR CELLS;
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EID: 84920708036
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/j.tsf.2013.10.073 Document Type: Conference Paper |
Times cited : (12)
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References (25)
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