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Volumn 571, Issue P3, 2014, Pages 756-761

Characterization of μc-Si:H/a-Si:H tandem solar cell structures by spectroscopic ellipsometry

Author keywords

a Si:H; Solar cell; Spectroscopic ellipsometry; Tandem structure; ZnO; c Si:H

Indexed keywords

AMORPHOUS SILICON; FILM PREPARATION; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; II-VI SEMICONDUCTORS; MICROCRYSTALS; MULTILAYERS; OPTICAL MULTILAYERS; OXIDE MINERALS; SOLAR CELLS; SPECTROSCOPIC ANALYSIS; SPECTROSCOPIC ELLIPSOMETRY; SUBSTRATES; TEXTURES; THIN FILM SOLAR CELLS; ZINC OXIDE;

EID: 84920708036     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2013.10.073     Document Type: Conference Paper
Times cited : (12)

References (25)
  • 16
    • 84982788451 scopus 로고    scopus 로고
    • Erratum
    • Erratum Appl. Phys. Lett. 69 1996 2137
    • (1996) Appl. Phys. Lett. , vol.69 , pp. 2137


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.