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Physical Review B - Condensed Matter and Materials Physics

Volumn 90, Issue 24, 2014, Pages

Topographic measurement of buried thin-film interfaces using a grazing resonant soft x-ray scattering technique

(9) Gann, Eliot a Watson, Anne a Tumbleston, John R a Cochran, Justin b Yan, Hongping a Wang, Cheng c Seok, Jaewook d Chabinyc, Michael b Ade, Harald a

a NORTH CAROLINA STATE UNIVERSITY (United States)

b University of California (United States)

c LAWRENCE BERKELEY NATIONAL LABORATORY (United States)

d North Carolina State University (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84918571519 PISSN: 10980121 EISSN: 1550235X Source Type: Journal
DOI: 10.1103/PhysRevB.90.245421 Document Type: Article

Times cited : (17)

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