Microstructure of polycrystalline PBTTT films: Domain mapping and structure formation

ACS Nano

Volumn 6, Issue 2, 2012, Pages 1849-1864

  Schuettfort, Torben ^a   Watts, Benjamin ^b   Thomsen, Lars ^c   Lee, Mijung ^d   Sirringhaus, Henning ^a   McNeill, Christopher R ^e  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^b PAUL SCHERRER INSTITUTE   (Switzerland)

^c AUSTRALIAN SYNCHROTRON   (Australia)

^d Kookmin University   (South Korea)

^e MONASH UNIVERSITY   (Australia)

Author keywords

conjugated polymers; morphology; NEXAFS; organic field effect transistors; polycrystallinity; STXM

Indexed keywords

ALIGNED FILMS; AS-CAST; DEGREE OF ORDER; DOMAIN BOUNDARY; DOMAIN MAPPING; DOMAIN ORIENTATION; DOMAIN STRUCTURE; MOLECULAR LAYER; NANORIBBONS; NEAR-EDGE X-RAY ABSORPTION FINE STRUCTURE SPECTROSCOPIES; NEXAFS; POLYCRYSTALLINE; POLYCRYSTALLINE FILM; POLYCRYSTALLINITY; SCANNING TRANSMISSION X RAY MICROSCOPY; STRUCTURAL ANISOTROPY; STRUCTURE FORMATIONS; STXM; SURFACE FEATURE; TOTAL ELECTRON YIELD; X RAY DICHROISM;

CONJUGATED POLYMERS; MICROSTRUCTURE; MOLECULAR ORIENTATION; MORPHOLOGY; SURFACE STRUCTURE; THIOPHENE; X RAY ABSORPTION NEAR EDGE STRUCTURE SPECTROSCOPY;

NANOSTRUCTURES;

EID: 84863246268     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/nn2051295     Document Type: Article

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