Measurement of transient atomic displacements in thin films with picosecond and femtometer resolution

Structural Dynamics

Volumn 1, Issue 3, 2014, Pages

  Kozina, M ^a,b   Hu, T ^a,c   Wittenberg, J S ^a   Szilagyi, E ^a,b   Trigo, M ^a   Miller, T A ^a,c   Uher, C ^d   Damodaran, A ^e   Martin, L ^e   Mehta, A ^f   Corbett, J ^f   Safranek, J ^f   Reis, D A ^a,b   Lindenberg, A M ^a,c  

^a SLAC NATIONAL ACCELERATOR LABORATORY   (United States)

^b STANFORD UNIVERSITY   (United States)

^c Stanford University   (United States)

^d UNIVERSITY OF MICHIGAN   (United States)

^e University of Illinois at Urbana Champaign   (United States)

^f SLAC NATIONAL ACCELERATOR LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

THIN FILMS;

ATOMIC DISPLACEMENT; DIFFRACTION ANGLE; EQUILIBRIUM DYNAMICS; HIGH-TIME RESOLUTION; ROCKING CURVE WIDTH; SCATTERING ANGLES; THREE ORDERS OF MAGNITUDE; TRANSIENT STRUCTURAL RESPONSE;

TRANSIENT ANALYSIS;

EID: 84912007761     PISSN: None     EISSN: 23297778     Source Type: Journal    
DOI: 10.1063/1.4875347     Document Type: Article

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