Shortening x-ray pulses for pump-probe experiments at synchrotrons

Journal of Applied Physics

Volumn 109, Issue 12, 2011, Pages

  Navirian, H A ^a   Herzog, M ^a   Goldshteyn, J ^a   Leitenberger, W ^b   Vrejoiu, I ^c   Khakhulin, D ^d   Wulff, M ^d   Shayduk, R ^a   Gaal, P ^b   Bargheer, M ^a,b  

^a HAHN MEITNER INSTITUT   (Germany)

^b UNIVERSITY OF POTSDAM   (Germany)

^c MAX PLANCK INSTITUTE OF MICROSTRUCTURE PHYSICS   (Germany)

^d EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTION PEAKS; EXPANSION WAVE; EXPERIMENTAL SCHEME; PUMP-PROBE EXPERIMENTS; SRTIO; TIME-RESOLUTION; TIME-SCALES; ULTRAFAST X-RAY DIFFRACTION; X RAY PULSE;

DIFFRACTION; MANGANESE OXIDE; PHOTOEXCITATION; X RAY DIFFRACTION;

OPTICAL PUMPING;

EID: 79960155161     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3601057     Document Type: Article

References (15)

1. R. Schoenlein, S. Chattopadhyay, H. Chong, T. Glover, P. Heimann, C. Shank, A. Zholents, and M. Zolotorev, Science 287, 2237 (2000). 10.1126/science.287.5461.2237 (Pubitemid 30177023)
2. S. Khan, K. Holldack, T. Kachel, R. Mitzner, and T. Quast, Phys. Rev. Lett. 97, 074801 (2006). 10.1103/PhysRevLett.97.074801
3. P. Beaud, S. Johnson, A. Streun, R. Abela, D. Abramsohn, D. Grolimund, F. Krasniqi, T. Schmidt, V. Schlott, and G. Ingold, Phys. Rev. Lett. 99, 174801 (2007). 10.1103/PhysRevLett.99.174801 (Pubitemid 350015166)
4. B. McNeil, Nat. Photonics 3, 375 (2009). 10.1038/nphoton.2009.110
5. M. Abo-Bakr, J. Feikes, K. Holldack, P. Kuske, W. B. Peatman, U. Schade, G. Wstefeld, and H.-W. Hbers, Phys. Rev. Lett. 90, 094801 (2003). 10.1103/PhysRevLett.90.094801
6. I. Radu, C. Stamm, N. Pontius, T. Kachel, P. Ramm, J.-U. Thiele, H. A. Drr, and C. H. Back, Phys. Rev. B 81, 104415 (2010). 10.1103/PhysRevB.81.104415
7. F. Zamponi, Z. Ansari, C. von Korff Schmising, P. Rothhardt, N. Zhavoronkov, M. Woerner, T. Elsaesser, M. Bargheer, T. Trobitzsch-Ryll, and M. Haschke, Appl. Phys. A 96, 51 (2009). 10.1007/s00339-009-5171-9
8. J. Larsson, P. Heimann, A. Lindenberg, P. Schuck, P. Bucksbaum, R. Lee, H. Padmore, J. Wark, and R. Falcone, App. Phys. A 66, 587 (1998). 10.1007/s003390050719
9. M. Herzog, W. Leitenberger, R. Shayduk, R. M. van der Veen, C. J. Milne, S. L. Johnson, I. Vrejoiu, M. Alexe, D. Hesse, and M. Bargheer, Appl. Phys. Lett. 96, 161906 (2010). 10.1063/1.3402773
10. M. Wulff, A. Plech, L. Eybert, R. Randler, F. Schotte, and P. Anfinrud, Faraday Discuss. 122, 13 (2003). 10.1039/b202740m
11. I. Vrejoiu, G. Le Rhun, L. Pintilie, D. Hesse, M. Alexe, and U. Gsele, Adv. Mater. 18, 1657 (2006). 10.1002/adma.v18:13
12. Here we adopt the notation of SL peak orders described in, e.g., G. Bauer and W. Richter, Optical Characterization of Epitaxial Semiconductor Layers (Springer, Berlin, 1996). The SRO/STO (002) ZOP corresponds to the (0 0 116) SL reflection of previous publications.
13. C. v. Korff Schmising, M. Bargheer, M. Kiel, N. Zhavoronkov, M. Woerner, T. Elsaesser, I. Vrejoiu, D. Hesse, and M. Alexe, Phys. Rev. Lett. 98, 257601 (2007). 10.1103/PhysRevLett.98.257601 (Pubitemid 47139945)
14. S. Yamanaka, T. Maekawa, H. Muta, T. Matsuda, S. Kobayashi, and K. Kurosaki, J. Solid State Chem. 177, 3484 (2004). 10.1016/j.jssc.2004.05.039
15. Y. H. Ren, M. Trigo, R. Merlin, V. Adyam, and Q. Li, Appl. Phys. Lett. 90, 251918 (2007). 10.1063/1.2751130 (Pubitemid 47141201)