Nanoscale heat transport studied by high-resolution time-resolved X-ray diffraction

New Journal of Physics

Volumn 13, Issue , 2011, Pages

  Shayduk, Roman ^a   Navirian, Hengameh ^a   Leitenberger, Wolfram ^b   Goldshteyn, Jevgenij ^a   Vrejoiu, Ionela ^c   Weinelt, Martin ^d   Gaal, Peter ^b   Herzog, Marc ^b   Von Korff Schmising, Clemens ^e   Bargheer, Matias ^a  

^a HAHN MEITNER INSTITUT   (Germany)

^b UNIVERSITY OF POTSDAM   (Germany)

^c MAX PLANCK INSTITUTE OF MICROSTRUCTURE PHYSICS   (Germany)

^d FREIE UNIVERSITÄT BERLIN   (Germany)

^e LUND UNIVERSITY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

HEAT TRANSPORT; HIGH REPETITION RATE; HIGH RESOLUTION; LATTICE TEMPERATURES; LONG LASTING; NANO SCALE; PICOSECONDS; SENSITIVITY TO TEMPERATURES; TEMPERATURE RISE; THERMAL LATTICES; TIME-RESOLVED X-RAY DIFFRACTION; TIME-SCALES; TRANSPORT OF HEAT; ULTRAFAST X-RAY DIFFRACTION;

LASER HEATING; MANGANESE OXIDE; THERMAL CONDUCTIVITY; THERMAL EXPANSION; X RAY DIFFRACTION;

HEAT TRANSFER;

EID: 80053417297     PISSN: 13672630     EISSN: None     Source Type: Journal    
DOI: 10.1088/1367-2630/13/9/093032     Document Type: Article

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