Following strain-induced mosaicity changes of ferroelectric thin films by ultrafast reciprocal space mapping

Physical Review Letters

Volumn 110, Issue 9, 2013, Pages

  Schick, D ^a   Bojahr, A ^a   Herzog, M ^a   Gaal, P ^b   Vrejoiu, I ^c   Bargheer, M ^a,b  

^a UNIVERSITY OF POTSDAM   (Germany)

^b HAHN MEITNER INSTITUT   (Germany)

^c MAX PLANCK INSTITUTE OF MICROSTRUCTURE PHYSICS   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COHERENT PHONONS; IN-PLANE LATTICES; MOSAIC STRUCTURE; MOSAICITY; OUT-OF-PLANE; OUT-OF-PLANE COMPRESSION; PICOSECOND TIME SCALE; PZT; RECIPROCAL SPACE MAPPING; TIME-RESOLVED; ULTRA-FAST; ULTRAFAST X-RAY DIFFRACTION;

FERROELECTRIC THIN FILMS; LATTICE VIBRATIONS; STRUCTURAL DYNAMICS; X RAY DIFFRACTION;

SOLIDS;

EID: 84874499588     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.110.095502     Document Type: Article

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