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Journal of Applied Physics

Volumn 110, Issue 10, 2011, Pages

Thermal transport in thin films measured by time-resolved, grazing incidence x-ray diffraction

(4) Walko, D A a Sheu, Y M b Trigo, M c,d Reis, D A c,d

a ARGONNE NATIONAL LABORATORY (United States)

b UNIVERSITY OF MICHIGAN (United States)

c SLAC NATIONAL ACCELERATOR LABORATORY (United States)

d STANFORD UNIVERSITY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANGLE OF INCIDENCE; BI FILMS; BRAGG PEAK POSITIONS; CRITICAL ANGLES; DEPTH SENSITIVITY; FILM CONDUCTIVITY; FILM TEMPERATURE; GRAZING INCIDENCE DIFFRACTION; GRAZING INCIDENCE X-RAY DIFFRACTION; INCIDENT ANGLES; KAPITZA CONDUCTANCE; LATTICE EXPANSION; TEMPERATURE GRADIENT; THERMAL TRANSPORT; TI: SAPPHIRE LASER; TIME-RESOLVED; TIME-RESOLVED X-RAY DIFFRACTION; TIME-SCALES; ULTRA-FAST; X RAY PENETRATION DEPTH;

OPTICS; SAPPHIRE; SINGLE CRYSTALS; THERMAL CONDUCTIVITY; X RAY DIFFRACTION;

INTERFACES (MATERIALS);

EID: 82555167449 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3661164 Document Type: Conference Paper

Times cited : (10)

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