Thermoelastic study of nanolayered structures using time-resolved X-ray diffraction at high repetition rate

Applied Physics Letters

Volumn 104, Issue 2, 2014, Pages

  Navirian, H A ^a   Schick, D ^a   Gaal, P ^a   Leitenberger, W ^a   Shayduk, R ^a   Bargheer, M ^a  

^a HAHN MEITNER INSTITUT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

HIGH REPETITION RATE; NEGATIVE THERMAL EXPANSION; OUT-OF-PLANE COMPRESSION; OUT-OF-PLANE LATTICES; PROPAGATION OF SOUNDS; RELATIVE ACCURACY; THERMOELASTIC RESPONSE; TIME-RESOLVED X-RAY DIFFRACTION;

LEAD; X RAY DIFFRACTION; ZIRCONIUM;

THERMOELASTICITY;

EID: 84893065256     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4861873     Document Type: Article

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30. The detailed evolution of the bump-like bending of the sample surface is a second-order effect, when we discuss the dynamics in the center of this bump which is probed by the X-rays.