Near-infrared light emission of Er3+-doped zirconium oxide thin films: An optical, structural and XPS study

Journal of Alloys and Compounds

Volumn 619, Issue , 2015, Pages 800-806

  Clabel H , J L ^a   Rivera, V A G ^b   Siu Li, M ^b   Nunes, L A O ^b   Leite, E R ^a   Schreiner, W H ^c   Marega, E ^b  

^a FEDERAL UNIVERSITY OF SÃO CARLOS   (Brazil)

^b UNIVERSITY OF SÃO PAULO   (Brazil)

^c FEDERAL UNIVERSITY OF PARANÁ   (Brazil)

Author keywords

Near infrared emission light; Photoluminescence; Photoluminescence quenching; XPS; Zirconium oxide thin films

Indexed keywords

ENERGY DISPERSIVE SPECTROSCOPY; ERBIUM COMPOUNDS; FOURIER TRANSFORM INFRARED SPECTROSCOPY; HEAT TREATMENT; II-VI SEMICONDUCTORS; INFRARED DEVICES; MORPHOLOGY; OXIDE FILMS; OXYGEN; PHOTOLUMINESCENCE; SCANNING ELECTRON MICROSCOPY; SURFACE MORPHOLOGY; X RAY PHOTOELECTRON SPECTROSCOPY; ZINC OXIDE; ZIRCONIUM COMPOUNDS;

ELECTRON BEAM DEPOSITIONS; ENERGY DISPERSIVE X RAY SPECTROSCOPY; NEAR-INFRARED EMISSIONS; NEAR-INFRARED EXCITATION; OXIDE THIN FILMS; PHOTOLUMINESCENCE MEASUREMENTS; PHOTOLUMINESCENCE QUENCHING; RADIATIVE TRANSITIONS;

THIN FILMS;

EID: 84907835414     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2014.09.007     Document Type: Article

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