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Volumn 42, Issue 1, 1999, Pages 80-86

Crystal structure of zirconia by Rietveld refinement

Author keywords

Crystal structure; Phase transformation; Rietveld refinement; Zirconia

Indexed keywords


EID: 0041636305     PISSN: 10069283     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF02872053     Document Type: Article
Times cited : (78)

References (14)
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    • (1991) J. Am. Ceram . Soc. , vol.74 , Issue.5 , pp. 1135
    • Cheng, Y.1    Thompson, D.P.2
  • 8
    • 0028368082 scopus 로고
    • Effect of dopants on zirconia stabilization - An X-ray absorption study: I. Trivalent dopants
    • Li, P., Chen, I. W., Penner-Hahn, J. E., Effect of dopants on zirconia stabilization - an X-ray absorption study: I. Trivalent dopants, J. Am. Ceram. Soc., 1994, 77(1): 118.
    • (1994) J. Am. Ceram. Soc. , vol.77 , Issue.1 , pp. 118
    • Li, P.1    Chen, I.W.2    Penner-Hahn, J.E.3
  • 10
    • 0001800865 scopus 로고
    • On the determination of unit-cell dimensions from inaccurate powder diffraction data
    • Winner, P. E., On the determination of unit-cell dimensions from inaccurate powder diffraction data, J. Appl. Cryst., 1976, 9: 216.
    • (1976) J. Appl. Cryst. , vol.9 , pp. 216
    • Winner, P.E.1
  • 11
    • 0002211129 scopus 로고
    • A profile refinement method for nuclear and magnetic structures
    • Rietveld, H. M., A profile refinement method for nuclear and magnetic structures, J. Appl. Cryst., 1969, 2: 65.
    • (1969) J. Appl. Cryst. , vol.2 , pp. 65
    • Rietveld, H.M.1
  • 13
    • 0002874056 scopus 로고
    • Defect chemistry, phase stability and properties of zirconia polycrystal
    • (ed. Badwal, S. P. S.), Lancaster: Technomic Publishing Co.
    • Kountouros, P., Petzow, G., Defect chemistry, phase stability and properties of zirconia polycrystal, in Science and Technology of Zirconia V (ed. Badwal, S. P. S.), Lancaster: Technomic Publishing Co., 1993, 30-48.
    • (1993) Science and Technology of Zirconia , vol.5 , pp. 30-48
    • Kountouros, P.1    Petzow, G.2
  • 14
    • 0000084791 scopus 로고
    • A new computer program for Rietveld analysis of X-ray powder diffraction patterns
    • Wiles, D. B., Young, R. A., A new computer program for Rietveld analysis of X-ray powder diffraction patterns, J. Appl. Cryst., 1981, 14: 149.
    • (1981) J. Appl. Cryst. , vol.14 , pp. 149
    • Wiles, D.B.1    Young, R.A.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.