Structure and optical characterization of photochemically prepared ZrO2 thin films doped with erbium and europium

Journal of Non-Crystalline Solids

Volumn 354, Issue 33, 2008, Pages 3919-3928

  Cabello, G ^a   Lillo, L ^a   Caro, C ^a   Buono Core, G E ^b   Chornik, B ^c   Soto, M A ^d  

^a UNIVERSIDAD DEL BÍO BÍO   (Chile)

^b PONTIFICIA UNIVERSIDAD CATÓLICA DE VALPARAÍSO   (Chile)

^c DEPARTAMENTO DE FÍSICA   (Chile)

^d PONTIFICIA UNIVERSIDAD CATÓLICA DE CHILE   (Chile)

Author keywords

Luminescence; Photo deposition; Spin coating; XPS

Indexed keywords

AMORPHOUS SILICON; ANNEALING; ATOMIC FORCE MICROSCOPY; ATOMIC SPECTROSCOPY; EMISSION SPECTROSCOPY; ERBIUM; EUROPIUM; FILM PREPARATION; HEAT TREATMENT; LIGHT EMISSION; LUMINESCENCE; MICROSCOPIC EXAMINATION; MOLECULAR ORBITALS; MOLECULAR SPECTROSCOPY; OXIDE FILMS; OXIDES; PHOTOELECTRON SPECTROSCOPY; RARE EARTH ELEMENTS; SCANNING PROBE MICROSCOPY; STEEL ANALYSIS; STOICHIOMETRY; SURFACE ROUGHNESS; SURFACE TREATMENT; THICK FILMS; X RAY FILMS; X RAY PHOTOELECTRON SPECTROSCOPY; ZIRCONIA; ZIRCONIUM; ZIRCONIUM COMPOUNDS;

(1 1 0) SURFACE; ATOMIC FORCE (AF); DIKETONATE COMPLEXES; ELSEVIER (CO); LANTHANIDE IONS; OPTICAL CHARACTERIZATIONS; PHOTOLUMINESCENCE (PL) EMISSIONS; POST ANNEALING TREATMENT; PRECURSOR FILMS; SI(1 0 0 ); X RAY PHOTOELECTRON SPECTROSCOPY (XPS); ZIRCONIUM OXIDES;

AMORPHOUS FILMS;

EID: 48049092810     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnoncrysol.2008.05.029     Document Type: Article

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