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Volumn 89, Issue 24, 2014, Pages

Minimum energy path and atomistic mechanism of the elementary step in oxygen diffusion in silicon: A density-functional study

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EID: 84902679411     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.89.245306     Document Type: Article
Times cited : (12)

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