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Volumn 154-155, Issue 1-3, 2008, Pages 187-192
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Challenges for ab initio defect modeling
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Author keywords
Charge correction; Defects; Gap correction; Semiconductor; Theory
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Indexed keywords
CALCULATIONS;
DEFECT DENSITY;
DEFECT ENGINEERING;
DENSITY FUNCTIONAL THEORY;
GROUND STATE;
AB INITIO;
CHARGE CORRECTION;
DEFECT ENGINEERING;
DEFECT MODEL;
DENSITY-FUNCTIONAL-THEORY;
FUNCTIONALS;
GAP CORRECTION;
SUPERCELL CALCULATIONS;
THEORY;
TOTAL ENERGY DIFFERENCES;
ENERGY GAP;
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EID: 56949084164
PISSN: 09215107
EISSN: None
Source Type: Journal
DOI: 10.1016/j.mseb.2008.10.024 Document Type: Article |
Times cited : (20)
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References (42)
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