Strain effects on in-plane conductance of the topological insulator Bi 2Te3

Applied Physics Letters

Volumn 104, Issue 16, 2014, Pages

  Hwang, Jin Heui ^a,b   Kwon, Sangku ^a,b   Park, Joonbum ^c   Kim, Jong Hun ^a,b   Lee, Jhinhwan ^b   Kim, Jun Sung ^c   Lyeo, Ho Ki ^d   Park, Jeong Young ^a,b  

^a Institute for Basic Science   (South Korea)

^b Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

^c Pohang University of Science and Technology (POSTECH)   (South Korea)

^d Korea Research Institute of Standards and Science   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRIC INSULATORS; STRESSES;

COMBINED EFFECT; CONDUCTIVE PROBE ATOMIC FORCE MICROSCOPIES; CURRENT MAPPING; ELECTRICAL TRANSPORT; MECHANICAL STRESS; SPIN-ORBIT COUPLINGS; TOPOLOGICAL INSULATORS; VACUUM ENVIRONMENT;

CURRENT DENSITY;

EID: 84900332283     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4873389     Document Type: Article

References (40)

1. J. E. Moore, Nature 464, 194 (2010). 10.1038/nature08916
2. M. Z. Hasan and C. L. Kane, Rev. Mod. Phys. 82, 3045 (2010). 10.1103/RevModPhys.82.3045
3. J. E. Moore and L. Balents, Phys. Rev. B 75, 121306 (2007). 10.1103/PhysRevB.75.121306
4. L. Fu and C. L. Kane, Phys. Rev. B 76, 045302 (2007). 10.1103/PhysRevB.76.045302
5. T. Zhang, P. Cheng, X. Chen, J.-F. Jia, X. Ma, K. He, L. Wang, H. Zhang, X. Dai, Z. Fang et al., Phys. Rev. Lett. 103, 266803 (2009). 10.1103/PhysRevLett.103.266803
6. P. Roushan, J. Seo, C. V. Parker, Y. S. Hor, D. Hsieh, D. Qian, A. Richardella, M. Z. Hasan, R. J. Cava, and A. Yazdani, Nature 460, 1106 (2009). 10.1038/nature08308
7. D. S. Kong and Y. Cui, Nat. Chem. 3, 845 (2011). 10.1038/nchem.1171
8. P. Ghaemi, R. S. K. Mong, and J. E. Moore, Phys. Rev. Lett. 105, 166603 (2010). 10.1103/PhysRevLett.105.166603
9. D. S. Kong, Y. Chen, J. J. Cha, Q. Zhang, J. G. Analytis, K. Lai, Z. Liu, S. S. Hong, K. J. Koski, S.-K. Mo et al., Nat. Nanotechnol. 6, 705 (2011). 10.1038/nnano.2011.172
10. Y. Wang, F. Xiu, L. Cheng, L. He, M. Lang, J. Tang, X. Kou, X. Yu, X. Jiang, Z. Chen et al., Nano Lett. 12, 1170 (2012). 10.1021/nl202920p
11. B. Sacepe, J. B. Oostinga, J. Li, A. Ubaldini, N. J. G. Couto, E. Giannini, and A. F. Morpurgo, Nat. Commun. 2, 575 (2011). 10.1038/ncomms1586
12. H. Steinberg, D. R. Gardner, Y. S. Lee, and P. Jarillo-Herrero, Nano Lett. 10, 5032 (2010). 10.1021/nl1032183
13. H. L. Peng, W. H. Dang, J. Cao, Y. L. Chen, W. Wu, W. S. Zheng, H. Li, Z. X. Shen, and Z. F. Liu, Nat. Chem. 4, 281 (2012). 10.1038/nchem.1277
14. W. L. Liu, X. Y. Peng, C. Tang, L. Z. Sun, K. W. Zhang, and J. X. Zhong, Phys. Rev. B 84, 245105 (2011). 10.1103/PhysRevB.84.245105
15. S. M. Young, S. Chowdhury, E. J. Walter, E. J. Mele, C. L. Kane, and A. M. Rappe, Phys. Rev. B 84, 085106 (2011). 10.1103/PhysRevB.84.085106
16. L. Zhao, J. W. Liu, P. Z. Tang, and W. H. Duan, Appl. Phys. Lett. 100, 131602 (2012). 10.1063/1.3699023
17. A. K. Mitchell, D. Schuricht, M. Vojta, and L. Fritz, Phys. Rev. B 87, 075430 (2013). 10.1103/PhysRevB.87.075430
18. M. T. Tran and K. S. Kim, Phys. Rev. B 82, 155142 (2010). 10.1103/PhysRevB.82.155142
19. T. Hanaguri, K. Igarashi, M. Kawamura, H. Takagi, and T. Sasagawa, Phys. Rev. B 82, 081305 (2010). 10.1103/PhysRevB.82.081305
20. P. Cheng, C. Song, T. Zhang, Y. Zhang, Y. Wang, J.-F. Jia, J. Wang, Y. Wang, B.-F. Zhu, X. Chen et al., Phys. Rev. Lett. 105, 076801 (2010). 10.1103/PhysRevLett.105.076801
21. S. S. Hong, W. Kundhikanjana, J. J. Cha, K. J. Lai, D. S. Kong, S. Meister, M. A. Kelly, Z. X. Shen, and Y. Cui, Nano Lett. 10, 3118 (2010). 10.1021/nl101884h
22. G. L. Hao, X. Qi, Y. D. Liu, Z. Y. Huang, H. X. Li, K. Huang, J. Li, L. W. Yang, and J. X. Zhong, J. Appl. Phys. 111, 114312 (2012). 10.1063/1.4729011
23. G. Koren, T. Kirzhner, E. Lahoud, K. B. Chashka, and A. Kanigel, Phys. Rev. B 84, 224521 (2011). 10.1103/PhysRevB.84.224521
24. Y. L. Chen, J. G. Analytis, J.-H. Chu. Z. K. Liu, S.-K. Mo, X. L. Qi, H. J. Zhang, D. H. Lu, X. Dai, Z. Fang et al., Science 325, 178 (2009). 10.1126/science.1173034
25. S. Kwon, S. Choi, H. J. Chung, H. Yang, S. Seo, S. H. Jhi, and J. Y. Park, Appl. Phys. Lett. 99, 013110 (2011). 10.1063/1.3609317
26. J. Y. Park, S. Maier, B. Hendriksen, and M. Salmeron, Mater. Today 13, 38 (2010). 10.1016/S1369-7021(10)70185-1
27. J. Y. Park, D. F. Ogletree, P. A. Thiel, and M. Salmeron, Science 313, 186 (2006). 10.1126/science.1125017
28. F. T. Huang, M. W. Chu, H. H. Kung, W. L. Lee, R. Sankar, S. C. Liou, K. K. Wu, Y. K. Kuo, and F. C. Chou, Phys. Rev. B 86, 081104 (2012). 10.1103/PhysRevB.86.081104
29. Y. Liu, Y. Y. Li, D. Gilks, V. K. Lazarov, M. Weinert, and L. Li, Phys. Rev. Lett. 110, 186804 (2013). 10.1103/PhysRevLett.110.186804
30. P. M. Coelho, G. A. S. Ribeiro, A. Malachias, V. L. Pimentel, W. S. Silva, D. D. Reis, M. S. C. Mazzoni, and R. Magalhaes-Paniago, Nano Lett. 13, 4517 (2013). 10.1021/nl402450b
31. R. W. Carpick, D. F. Ogletree, and M. Salmeron, Appl. Phys. Lett. 70, 1548 (1997). 10.1063/1.118639
32. M. Enachescu, R. J. A. van den Oetelaar, R. W. Carpick, D. F. Ogletree, C. F. J. Flipse, and M. Salmeron, Phys. Rev. Lett. 81, 1877 (1998). 10.1103/PhysRevLett.81.1877
33. B. V. Derjaguin, V. M. Muller, and Y. P. Toporov, Prog. Surf. Sci. 45, 131 (1994). 10.1016/0079-6816(94)90044-2
34. J. Y. Park, D. F. Ogletree, M. Salmeron, C. J. Jenks, and P. A. Thiel, Tribol. Lett. 17, 629 (2004). 10.1023/B:TRIL.0000044513.85505.60
35. K. S. Yang, W. Setyawan, S. D. Wang, M. B. Nardelli, and S. Curtarolo, Nature Mater. 11, 614 (2012). 10.1038/nmat3332
36. M. Bianchi, D. D. Guan, S. N. Bao, J. L. Mi, B. B. Iversen, P. D. C. King, and P. Hofmann, Nat. Commun. 1, 128 (2010). 10.1038/ncomms1131
37. M. Koleini, T. Frauenheim, and B. H. Yan, Phys. Rev. Lett. 110, 016403 (2013). 10.1103/PhysRevLett.110.016403
38. C. Y. Chen, S. He, H. Weng, W. Zhang, L. Zhao, H. Liu, X. Jia, D. Mou, S. Liu, J. He et al., Proc. Natl. Acad. Sci. U.S.A. 109, 3694 (2012). 10.1073/pnas.1115555109
39. L. Fu, Phys. Rev. Lett. 103, 266801 (2009). 10.1103/PhysRevLett.103. 266801
40. J. Y. Park, R. J. Phaneuf, D. F. Ogletree, and M. Salmeron, Appl. Phys. Lett. 86, 172105 (2005). 10.1063/1.1906297