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Volumn 111, Issue 11, 2012, Pages

Ambipolar charge injection and transport of few-layer topological insulator Bi 2Te 3 and Bi 2Se 3 nanoplates

(9) Hao, Guolin a Qi, Xiang a Liu, Yundan a Huang, Zongyu a Li, Hongxing a Huang, Kai a Li, Jun a Yang, Liwen a Zhong, Jianxin a

a XIANGTAN UNIVERSITY (China)

Author keywords

[No Author keywords available]

Indexed keywords

AMBIENT ENVIRONMENT; AMBIPOLAR; ATOMIC FORCE MICROSCOPE (AFM); ELECTRONS AND HOLES; ELECTROSTATIC PROPERTIES; KELVIN PROBE FORCE MICROSCOPY; NANO-METER SCALE; NANO-PLATE; NANOPLATES; TOPOLOGICAL INSULATORS;

ATOMIC FORCE MICROSCOPY; ELECTRIC INSULATORS; ELECTRONIC PROPERTIES; ELECTROSTATICS; SEMICONDUCTING SELENIUM COMPOUNDS;

NANOSTRUCTURES;

EID: 84863304658 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.4729011 Document Type: Conference Paper

Times cited : (24)

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