Feng Shui of supercomputer memory positional effects in DRAM and SRAM faults

International Conference for High Performance Computing, Networking, Storage and Analysis, SC

Volumn , Issue , 2013, Pages

  Sridharan, Vilas ^a   Stearley, Jon ^b   DeBardeleben, Nathan ^c   Blanchard, Sean ^c   Gurumurthi, Sudhanva ^a  

^a ADVANCED MICRO DEVICES   (United States)

^b SANDIA NATIONAL LABORATORIES   (United States)

^c LOS ALAMOS NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIGITAL STORAGE; STATIC RANDOM ACCESS STORAGE; SUPERCOMPUTERS;

DATA CENTERS; DRAM DEVICES; FAULT RATES; HIGH PERFORMANCE COMPUTING SYSTEMS; PHYSICAL LOCATIONS; TRANSIENT FAULTS;

DYNAMIC RANDOM ACCESS STORAGE;

EID: 84899689608     PISSN: 21674329     EISSN: 21674337     Source Type: Conference Proceeding    
DOI: 10.1145/2503210.2503257     Document Type: Conference Paper

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