The random telegraph signal behavior of intermittently stuck bits in SDRAMs

IEEE Transactions on Nuclear Science

Volumn 56, Issue 6, 2009, Pages 3057-3064

  Chugg, Andrew Michael ^a   Burnell, Andrew J ^a   Duncan, Peter H ^a   Parker, Sarah ^a   Ward, Jonathan J ^a  

^a Radiation Effects Group   (United Kingdom)

Author keywords

Hard errors; Neutrons; Protons; Single event effects

Indexed keywords

DEPLETION REGION; DISCRETE LEVELS; DISPLACEMENT DAMAGES; HARD ERRORS; HIGH-ENERGY NEUTRON; HOT PIXELS; MICRODOSE; PROTON INTERACTIONS; PSEUDO RANDOM; RADIATION-INDUCED; RANDOM TELEGRAPH SIGNALS; SINGLE EVENT EFFECTS; SYNCHRONOUS DYNAMIC RANDOM ACCESS MEMORIES; THERMAL VIBRATION; THERMALLY INDUCED; TIME-SCALES;

CHARGE COUPLED DEVICES; ERRORS; INTEGRATED CIRCUITS; NEUTRONS; PROTONS; RADIATION DAMAGE; RANDOM ACCESS STORAGE; TELEGRAPH;

LEAKAGE CURRENTS;

EID: 72349094514     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2009.2032184     Document Type: Conference Paper

References (13)

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