SEEs induced by high-energy protons and neutrons in SDRAM

IEEE Radiation Effects Data Workshop

Volumn , Issue , 2011, Pages 164-168

  Quinn, Heather ^a   Graham, Paul ^a   Fairbanks, Tom ^a  

^a LOS ALAMOS NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BROAD SPECTRUM; HIGH ENERGY PROTON; LOS ALAMOS NATIONAL LABORATORY; MASSACHUSETTS; NEUTRON SCIENCE; SYNCHRONOUS DYNAMIC RANDOM ACCESS MEMORIES;

DYNAMIC RANDOM ACCESS STORAGE; HIGH ENERGY PHYSICS; NEUTRON IRRADIATION; NEUTRONS; PROTONS;

RADIATION EFFECTS;

EID: 81455143430     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/REDW.2010.6062524     Document Type: Conference Paper

References (6)

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2. J.-P. David, F. Bezerra, E. Lorfvre, T. Nuns, and C. Inguimbert, "Light particle-induced single event degradation in SDRAMs,"Nuclear Science, IEEE Transactions on, Vol. 53, No. 6, pp. 3544-3549, Dec. 2006. (Pubitemid 46113360)
3. R. Koga, P. Yu, J. George, and S. Bielat, "Sensitivity of 2 Gb DDR2 SDRAMs to protons and heavy ions," in Radiation Effects Data Workshop (REDW), 2010 IEEE, July 2010, p. 6.
4. C. Hafer, M. Von Thun, M. Leslie, F. Sievert, and A. Jordan, "Commercially designed and manufactured SDRAM SEE data,"in Radiation Effects Data Workshop (REDW), 2010 IEEE, July 2010, p. 5.
5. B. Schroeder, E. Pinheiro, and W.-D. Weber, "DRAM errors in the wild: a large-scale field study," in Proceedings of the eleventh international joint conference on Measurement and modeling of computer systems, ser. SIGMETRICS '09. New York, NY, USA: ACM, 2009, pp. 193-204. [Online]. Available: http://doi.acm.org/10.1145/1555349.1555372
6. on web at http://sourceforge.net/projects/bluesmoke/ last accessed on 12/23/2010.