Cosmic rays don't strike twice: Understanding the nature of DRAM errors and the implications for system design

International Conference on Architectural Support for Programming Languages and Operating Systems - ASPLOS

Volumn , Issue , 2012, Pages 111-122

  Hwang, Andy A ^a   Stefanovici, Ioan A ^a   Schroeder, Bianca ^a  

^a UNIVERSITY OF TORONTO   (Canada)

Author keywords

correctable errors; DRAM errors; field study; reliability; uncorrectable errors

Indexed keywords

DATA CENTERS; DATA SETS; DIVERSE RANGE; ERROR CHARACTERISTICS; ERROR PATTERNS; FIELD STUDIES; MAIN MEMORY; MEASUREMENT STUDY; MEMORY ERROR; MODELING SYSTEMS; PRODUCTION SYSTEM; PROTECTION MECHANISMS; RESILIENT SYSTEMS; SOFT ERROR; TYPICAL PATTERNS;

DYNAMIC RANDOM ACCESS STORAGE; PRODUCTION ENGINEERING; RELIABILITY; SYSTEMS ANALYSIS;

ERRORS;

EID: 84858781341     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/2150976.2150989     Document Type: Conference Paper

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