DRAM errors in the wild: A large-scale field study

Communications of the ACM

Volumn 54, Issue 2, 2011, Pages 100-107

  Schroeder, Bianca ^a   Pinheiro, Eduardo ^b   Weber, Wolf Dietrich ^b  

^a UNIVERSITY OF TORONTO   (Canada)

^b GOOGLE INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHIP DENSITY; DATA COVER; DYNAMIC RANDOM ACCESS MEMORY; ERROR MODE; ERROR RATE; EXTERNAL FACTORS; FIELD STUDIES; HARDWARE FAILURES; IN-LINE; LAB CONDITIONS; LABORATORY CONDITIONS; MEMORY ERROR; MEMORY MODULES; MEMORY TECHNOLOGY; MULTIPLE VENDORS; ORDERS OF MAGNITUDE; REPLACEMENT COSTS; SERVICE DISRUPTIONS; SOFT ERROR; STATISTICAL PROPERTIES;

COMPUTER HARDWARE; RANDOM ERRORS;

DYNAMIC RANDOM ACCESS STORAGE;

EID: 79551703768     PISSN: 00010782     EISSN: 15577317     Source Type: Journal    
DOI: 10.1145/1897816.1897844     Document Type: Article

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