Using three-dimensional 3D grazing-incidence small-angle X-ray scattering (GISAXS) analysis to probe pore deformation in mesoporous silica films

ACS Applied Materials and Interfaces

Volumn 6, Issue 4, 2014, Pages 2686-2691

  Panduro, Elvia Anabela Chavez ^a,b   Granlund, Håvard ^c   Sztucki, Michael ^b   Konovalov, Oleg ^b   Breiby, Dag W ^c   Gibaud, Alain ^a  

^a UNIVERSITÉ DU MAINE   (France)

^b EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^c NORWEGIAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Norway)

Author keywords

anisotropy; deformation of pores; GISAXS; mesoporous silica thin films

Indexed keywords

DISTORTED WAVE BORN APPROXIMATION; GI-SAXS; GRAZING INCIDENCE SMALL-ANGLE X-RAY SCATTERING; MESOPOROUS SILICA FILM; MESOPOROUS SILICA THIN FILMS; MESOSCALE STRUCTURE; STRUCTURAL INFORMATION; THREE DIMENSIONAL (3D) STRUCTURES;

ALGORITHMS; ANISOTROPY; BORN APPROXIMATION; CRYSTALLOGRAPHY; DEFORMATION; PROBES; THIN FILMS; TWO DIMENSIONAL;

THREE DIMENSIONAL;

EID: 84896853106     PISSN: 19448244     EISSN: 19448252     Source Type: Journal    
DOI: 10.1021/am404602t     Document Type: Article

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