Semiconductor nanorod self-assembly at the liquid/air interface studied by in situ GISAXS and ex situ TEM

Nano Letters

Volumn 12, Issue 11, 2012, Pages 5515-5523

  Pietra, Francesca ^a   Rabouw, Freddy T ^a   Evers, Wiel H ^a   Byelov, Dima V ^a   Petukhov, Andrei V ^a   De Mello Donegá, Celso ^a   Vanmaekelbergh, Daniël ^a  

^a UTRECHT UNIVERSITY   (Netherlands)

Author keywords

grazing incidence small angle X ray scattering; Nanocrystals; self assembly; superlattice

Indexed keywords

ANISOTROPIC THIN FILMS; CDSE/CDS; EX SITU; EX SITU TEM; GI-SAXS; GRAZING INCIDENCE; GRAZING INCIDENCE SMALL-ANGLE X-RAY SCATTERING; INITIAL CONCENTRATION; LIQUID/AIR INTERFACE; SELF-ASSEMBLE; SEMICONDUCTOR NANORODS; SMALL ANGLE X-RAY SCATTERING; SUPERSTRUCTURE FORMATION; SYSTEMATIC VARIATION; TIME-RESOLVED;

MEMBRANES; NANOCRYSTALS; NANORODS; SELF ASSEMBLY; TRANSMISSION ELECTRON MICROSCOPY;

SUPERLATTICES;

CADMIUM DERIVATIVE; CADMIUM SELENIDE; METAL NANOPARTICLE; NANOTUBE; SELENIUM DERIVATIVE; SOLVENT;

AIR; ANISOTROPY; ARTICLE; CHEMISTRY; COLLOID; EQUIPMENT DESIGN; MATERIALS TESTING; METHODOLOGY; NANOTECHNOLOGY; SEMICONDUCTOR; SMALL ANGLE SCATTERING; TIME; TRANSMISSION ELECTRON MICROSCOPY;

AIR; ANISOTROPY; CADMIUM COMPOUNDS; COLLOIDS; EQUIPMENT DESIGN; MATERIALS TESTING; METAL NANOPARTICLES; MICROSCOPY, ELECTRON, TRANSMISSION; NANOTECHNOLOGY; NANOTUBES; SCATTERING, SMALL ANGLE; SELENIUM COMPOUNDS; SEMICONDUCTORS; SOLVENTS; TIME FACTORS;

EID: 84869170991     PISSN: 15306984     EISSN: 15306992     Source Type: Journal    
DOI: 10.1021/nl302360u     Document Type: Article

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