General method for simulation of 2D GISAXS intensities for any nanostructured film using discrete fourier transforms

Journal of Physical Chemistry C

Volumn 111, Issue 21, 2007, Pages 7645-7654

  Tate, Michael P ^a   Hillhouse, Hugh W ^a  

^a PURDUE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATION TIME; DOMAIN SIZE; PORE CONNECTIVITY; SIMULATION CODE;

CARRIER CONCENTRATION; DISCRETE FOURIER TRANSFORMS; NANOSTRUCTURED MATERIALS; POLYDISPERSITY; SELF ASSEMBLY; X RAY SCATTERING;

THIN FILMS;

EID: 34250321723     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp066111n     Document Type: Article

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