Determination by x-ray reflectivity and small angle x-ray scattering of the porous properties of mesoporous silica thin films

Applied Physics Letters

Volumn 86, Issue 11, 2005, Pages 1-3

  Dourdain, Sandrine ^a   Bardeau, Jean François ^a   Colas, Maggy ^a   Smarsly, Bernd ^b   Mehdi, Ahmad ^c   Ocko, Benjamin M ^d   Gibaud, Alain ^a  

^a UNIVERSITÉ DU MAINE   (France)

^b MAX PLANCK INSTITUTE OF COLLOIDS AND INTERFACES   (Germany)

^c UNIVERSITÉ DE MONTPELLIER   (France)

^d BROOKHAVEN NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

GRAZING INCIDENT SMALL ANGLE X-RAY SCATTERING (GISAXS); SILICA MATRIX; SILICA THIN FILMS; X-RAY REFLECTIVITY (XR);

BLOCK COPOLYMERS; CARRIER CONCENTRATION; MESOPOROUS MATERIALS; POROSITY; POROUS MATERIALS; SILICA; SURFACE ACTIVE AGENTS; X RAY SCATTERING;

THIN FILMS;

EID: 17944362995     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1887821     Document Type: Article

References (10)

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6. The PEO and PPO blocks are soluble in ethanol; therefore, the rinsing procedure was chosen to avoid the large shrinkage or even worse the collapse of the oxide structure when the surfactant is removed by annealing.
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