메뉴 건너뛰기




Volumn 253, Issue 1 SPEC. ISS., 2006, Pages 3-11

Analysis of mesoporous thin films by X-ray reflectivity, optical reflectivity and grazing incidence small angle X-ray scattering

Author keywords

Mesoporous; Reflectivity; Scattering

Indexed keywords

CARRIER CONCENTRATION; MESOPOROUS MATERIALS; POROSITY; REFLECTION; REFRACTION; SCATTERING; SILICA;

EID: 33750504245     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2006.05.121     Document Type: Article
Times cited : (34)

References (40)
  • 29
    • 33750497518 scopus 로고    scopus 로고
    • S. Dourdain, A. Gibaud, Appl. Phys. Lett., submitted for publication.
  • 36
    • 0036344848 scopus 로고    scopus 로고
    • Program available at http://www.esrf.fr/computing/scientific/joint_projects/IsGISAXS/figures/doc/manual.html
    • Lazzari R. J. Appl. Cryst. 35 (2002) 406. http://www.esrf.fr/computing/scientific/joint_projects/IsGISAXS/figures/doc/manual.html Program available at http://www.esrf.fr/computing/scientific/joint_projects/IsGISAXS/figures/doc/manual.html
    • (2002) J. Appl. Cryst. , vol.35 , pp. 406
    • Lazzari, R.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.