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Volumn 21, Issue 9, 2005, Pages 3858-3866

Quantitative SAXS analysis of oriented 2D hexagonal cylindrical silica mesostructures in thin films obtained from nonionic surfactants

Author keywords

[No Author keywords available]

Indexed keywords

HEXAGONAL CYLINDRICAL SILICA; MESOPOROUS FILMS; MESOSTRUCTURES; NONIONIC SURFACTANTS;

EID: 18544390966     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la046916r     Document Type: Article
Times cited : (46)

References (35)
  • 23
    • 0034857557 scopus 로고    scopus 로고
    • Göltner, G.; Smarsly, B.; Berton, B.; Antonietti, M. 2001, 13, 1617-1624
    • Göltner, G.; Smarsly, B.; Berton, B.; Antonietti, M. 2001, 13, 1617-1624.
  • 35
    • 0011722745 scopus 로고    scopus 로고
    • Specular reflectivity from smooth and rough surfaces
    • Daillant, J., Gibaud, A.; Springer: Paris
    • Gibaud, A. Specular reflectivity from smooth and rough surfaces. InX-ray and Neutron Reflectivity: Principle and Applications; Daillant, J., Gibaud, A.; Springer: Paris, 1999; pp 87-115.
    • (1999) X-ray and Neutron Reflectivity: Principle and Applications , pp. 87-115
    • Gibaud, A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.