Measurement techniques for RF Nanoelectronic Devices: New equipment to overcome the problems of impedance and scale mismatch

IEEE Microwave Magazine

Volumn 15, Issue 1, 2014, Pages 30-39

  Happy, Henri ^a   Haddadi, Kamel ^a   Theron, Didier ^a   Lasri, Tuami ^a   Dambrine, Giles ^a  

^a INSTITUT D ELECTRONIQUE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CORRELATED MATERIALS; EMERGING TECHNOLOGIES; MEASUREMENT TECHNIQUES; NANOELECTRONIC DEVICES; PERFORMANCE CHARACTERISTICS; SEMICONDUCTOR INDUSTRY; STRINGENT REQUIREMENT; TRADITIONAL MATERIALS;

MICROWAVE INTEGRATED CIRCUITS; RADIATION;

SEMICONDUCTOR DEVICE MANUFACTURE;

EID: 84893584925     PISSN: 15273342     EISSN: None     Source Type: Journal    
DOI: 10.1109/MMM.2013.2288710     Document Type: Article

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