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Volumn 59, Issue 8, 2011, Pages 2123-2130

A method for direct impedance measurement in microwave and millimeter-wave bands

Author keywords

Calibration; impedance measurement; microwave circuits; microwave measurements; nanotechnology

Indexed keywords

COMMON VECTORS; DEVICE UNDER TEST; IMPEDANCE MEASUREMENT; INPUT IMPEDANCE; LOW IMPEDANCE; MILLIMETER-WAVE BAND; NOVEL METHODS; REFERENCE IMPEDANCE; STABLE MEASUREMENTS;

EID: 80051799875     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMTT.2011.2141148     Document Type: Article
Times cited : (17)

References (11)
  • 1
    • 33749246590 scopus 로고    scopus 로고
    • Nanotube technology for microwave applications
    • DOI 10.1109/MWSYM.2005.1516766, 1516766, 2005 IEEE MTT-S International Microwave Symposium Digest
    • P. J. Burke, Z. Yu, S. Li, and C. Rutherglen, "Nanotube technology for microwave applications", in IEEE MTT-S Int. Microw. Symp. Dig., Jun. 2005, pp. 897-900. (Pubitemid 44479078)
    • (2005) IEEE MTT-S International Microwave Symposium Digest , vol.2005 , pp. 897-900
    • Burke, P.J.1    Yu, Z.2    Li, S.3    Rutherglen, C.4
  • 2
    • 21244484984 scopus 로고    scopus 로고
    • Single-walled carbon nanotube electronics
    • Mar
    • P. L. McEuen, M. S. Fuhrer, and H. Park, "Single-walled carbon nanotube electronics", IEEE Trans. Nanotechnol., vol. 1, no. 1, pp. 78-85, Mar. 2002.
    • (2002) IEEE Trans. Nanotechnol. , vol.1 , Issue.1 , pp. 78-85
    • McEuen, P.L.1    Fuhrer, M.S.2    Park, H.3
  • 3
    • 80051792823 scopus 로고    scopus 로고
    • Design of scanning capacitance microscope
    • Broomfield, CO, Dec
    • M. Richter, H. Tanbakuchi, and M. Whitener, "Design of scanning capacitance microscope", in Proc. 68th ARFTG Conf., Broomfield, CO, Dec. 2006, pp. 58-61.
    • (2006) Proc. 68th ARFTG Conf. , pp. 58-61
    • Richter, M.1    Tanbakuchi, H.2    Whitener, M.3
  • 4
    • 67649213389 scopus 로고    scopus 로고
    • A simple method for extreme impedances measurement
    • Tempe, AZ, Nov
    • M. Randus and K. Hoffmann, "A simple method for extreme impedances measurement", in Proc. 70th ARFTG Conf., Tempe, AZ, Nov. 2007, pp. 46-50.
    • (2007) Proc. 70th ARFTG Conf. , pp. 46-50
    • Randus, M.1    Hoffmann, K.2
  • 5
    • 67649213389 scopus 로고    scopus 로고
    • A simple method for extreme impedances measurement-experimental testing
    • Portland, OR, Dec
    • M. Randus and K. Hoffmann, "A simple method for extreme impedances measurement-Experimental testing", in Proc. 72nd ARFTG Conf., Portland, OR, Dec. 2008, pp. 40-44.
    • (2008) Proc. 72nd ARFTG Conf. , pp. 40-44
    • Randus, M.1    Hoffmann, K.2
  • 7
    • 77958183473 scopus 로고    scopus 로고
    • A novel method for direct impedance measurement in microwave and mm-wave bands
    • Anaheim, CA, Jun
    • M. Randus and K. Hoffmann, "A novel method for direct impedance measurement in microwave and mm-wave bands", in Proc. 75th ARFTG Conf., Anaheim, CA, Jun. 2010, pp. 83-87.
    • (2010) Proc. 75th ARFTG Conf. , pp. 83-87
    • Randus, M.1    Hoffmann, K.2
  • 8
    • 80051786548 scopus 로고    scopus 로고
    • ET Industries, Boonton, NJ, Online
    • "Passive microwave components", ET Industries, Boonton, NJ, 2010. [Online]. Available: http://www.etiworld.com
    • (2010) Passive Microwave Components
  • 10
    • 79951779126 scopus 로고    scopus 로고
    • Calculation of maximal applicable gain for the generalized and the direct method for extreme impedances measurement
    • Clearwater, FL, Dec
    • M. Randus and K. Hoffmann, "Calculation of maximal applicable gain for the generalized and the direct method for extreme impedances measurement", in Proc. 76th ARFTG Conf., Clearwater, FL, Dec. 2010, pp. 63-68.
    • (2010) Proc. 76th ARFTG Conf. , pp. 63-68
    • Randus, M.1    Hoffmann, K.2
  • 11
    • 80051791414 scopus 로고    scopus 로고
    • Mini-Circuits, Brooklyn, NY, Online
    • "Amplifiers", Mini-Circuits, Brooklyn, NY, 2010. [Online]. Available: http://www.mini-circuits.com
    • (2010) Amplifiers


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.