-
1
-
-
33749246590
-
Nanotube technology for microwave applications
-
DOI 10.1109/MWSYM.2005.1516766, 1516766, 2005 IEEE MTT-S International Microwave Symposium Digest
-
P. J. Burke, Z. Yu, S. Li, and C. Rutherglen, "Nanotube technology for microwave applications", in IEEE MTT-S Int. Microw. Symp. Dig., Jun. 2005, pp. 897-900. (Pubitemid 44479078)
-
(2005)
IEEE MTT-S International Microwave Symposium Digest
, vol.2005
, pp. 897-900
-
-
Burke, P.J.1
Yu, Z.2
Li, S.3
Rutherglen, C.4
-
2
-
-
21244484984
-
Single-walled carbon nanotube electronics
-
Mar
-
P. L. McEuen, M. S. Fuhrer, and H. Park, "Single-walled carbon nanotube electronics", IEEE Trans. Nanotechnol., vol. 1, no. 1, pp. 78-85, Mar. 2002.
-
(2002)
IEEE Trans. Nanotechnol.
, vol.1
, Issue.1
, pp. 78-85
-
-
McEuen, P.L.1
Fuhrer, M.S.2
Park, H.3
-
3
-
-
80051792823
-
Design of scanning capacitance microscope
-
Broomfield, CO, Dec
-
M. Richter, H. Tanbakuchi, and M. Whitener, "Design of scanning capacitance microscope", in Proc. 68th ARFTG Conf., Broomfield, CO, Dec. 2006, pp. 58-61.
-
(2006)
Proc. 68th ARFTG Conf.
, pp. 58-61
-
-
Richter, M.1
Tanbakuchi, H.2
Whitener, M.3
-
4
-
-
67649213389
-
A simple method for extreme impedances measurement
-
Tempe, AZ, Nov
-
M. Randus and K. Hoffmann, "A simple method for extreme impedances measurement", in Proc. 70th ARFTG Conf., Tempe, AZ, Nov. 2007, pp. 46-50.
-
(2007)
Proc. 70th ARFTG Conf.
, pp. 46-50
-
-
Randus, M.1
Hoffmann, K.2
-
5
-
-
67649213389
-
A simple method for extreme impedances measurement-experimental testing
-
Portland, OR, Dec
-
M. Randus and K. Hoffmann, "A simple method for extreme impedances measurement-Experimental testing", in Proc. 72nd ARFTG Conf., Portland, OR, Dec. 2008, pp. 40-44.
-
(2008)
Proc. 72nd ARFTG Conf.
, pp. 40-44
-
-
Randus, M.1
Hoffmann, K.2
-
6
-
-
67649198825
-
Wideband measurement of extreme impedances with a multistate reflectometer
-
Portland, OR, Dec
-
A. Lewandowski, D. LeGolvan, R. A. Ginley, T. M. Wallis, A. Imtiaz, and P. Kabos, "Wideband measurement of extreme impedances with a multistate reflectometer", in Proc. 72nd ARFTG Conf., Portland, OR, Dec. 2008, pp. 45-49.
-
(2008)
Proc. 72nd ARFTG Conf.
, pp. 45-49
-
-
Lewandowski, A.1
LeGolvan, D.2
Ginley, R.A.3
Wallis, T.M.4
Imtiaz, A.5
Kabos, P.6
-
7
-
-
77958183473
-
A novel method for direct impedance measurement in microwave and mm-wave bands
-
Anaheim, CA, Jun
-
M. Randus and K. Hoffmann, "A novel method for direct impedance measurement in microwave and mm-wave bands", in Proc. 75th ARFTG Conf., Anaheim, CA, Jun. 2010, pp. 83-87.
-
(2010)
Proc. 75th ARFTG Conf.
, pp. 83-87
-
-
Randus, M.1
Hoffmann, K.2
-
8
-
-
80051786548
-
-
ET Industries, Boonton, NJ, Online
-
"Passive microwave components", ET Industries, Boonton, NJ, 2010. [Online]. Available: http://www.etiworld.com
-
(2010)
Passive Microwave Components
-
-
-
10
-
-
79951779126
-
Calculation of maximal applicable gain for the generalized and the direct method for extreme impedances measurement
-
Clearwater, FL, Dec
-
M. Randus and K. Hoffmann, "Calculation of maximal applicable gain for the generalized and the direct method for extreme impedances measurement", in Proc. 76th ARFTG Conf., Clearwater, FL, Dec. 2010, pp. 63-68.
-
(2010)
Proc. 76th ARFTG Conf.
, pp. 63-68
-
-
Randus, M.1
Hoffmann, K.2
-
11
-
-
80051791414
-
-
Mini-Circuits, Brooklyn, NY, Online
-
"Amplifiers", Mini-Circuits, Brooklyn, NY, 2010. [Online]. Available: http://www.mini-circuits.com
-
(2010)
Amplifiers
-
-
|