Interferometric technique for microwave measurement of high impedances

IEEE MTT-S International Microwave Symposium Digest

Volumn , Issue , 2012, Pages

  Haddadi, Kamel ^a   Lasri, Tuami ^a  

^a INSTITUT D ELECTRONIQUE   (France)

Author keywords

Calibration; Impedance measurement; Multi port; Near field microwave microscopy; Network analyzer

Indexed keywords

BROADBAND MEASUREMENTS; BROADBAND OPERATION; HIGH IMPEDANCE; IMPEDANCE MEASUREMENT; INTERFEROMETRIC TECHNIQUES; LIQUID MEDIA; MICROWAVE IMPEDANCE; MULTI-PORT; NEAR-FIELD MICROWAVE MICROSCOPES; NEAR-FIELD MICROWAVE MICROSCOPY; POWER DIVIDER; VECTOR NETWORK ANALYZERS;

CALIBRATION; ELECTRIC NETWORK ANALYZERS; MICROWAVES;

INTERFEROMETRY;

EID: 84866786114     PISSN: 0149645X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/MWSYM.2012.6259554     Document Type: Conference Paper

References (8)

1. P. Rice, T. M. Wallis, S. E. Russek, and P. Kabos, "Broadband electrical characterization of multi walled carbon nanotubes and contacts," Nano Lett., vol. 7, no. 4, pp. 1086-1090, Mars 2007
2. L. Nougaret, G. Dambrine, S. Lepilliet, H. Happy, N. Chi mot, V. Derycke, and J.-P. Bourgoin, "Gigahertz characterization of a single carbon nanotube", Appl. Phys. Lett., vol. 96, no. 4, pp. 042109-1-042109-3, Jan. 2010
3. S. Fabiani, D. Mencarelli, A. Di Donato, T. Monti, G. Venanzoni, A Morini, T. Rozzi, and M. Farina, "Broadband Scanning Microwave Microscopy investigation of graphene," Proc. IEEE MTT-S International Microw. Symp., pp. 1-4, June 2011
4. S. M. Anlage, V. V. Talanov, and A. R. Schwartz, "Principles of nearfield microwave microscopy," Scanning Probe Microscopy: Electrical and Electromechanical Phenomena at the Nanoscale, S. Kalinin and A. Gruverman, Eds. New York: Springer Sci., pp. 215-253, 2007
5. M. Wang, K. Haddadi, O. Benzaim, D. Glay, and T. Lasri, "Six-port based near-field millimeter-wave microscope using a slit scanning probe", Proc. 4th IEEE Int. Conf on Electromagnetic Near:field Characterization & Imaging, pp. 17-22, Taipei, Taiwan, June 2009
6. K. Haddadi, D. Glay, and T. Lasri, "A 60 GHz scanning near-field microscope with high spatial resolution sub-surface imaging", IEEE Microw. Wireless Compon. Lett., vol. 21, no. 11, pp. 625-627, Nov. 2011
7. M. Randus and K. Hoffmann, "A simple method for extreme impedances measurement," in Proc. 70th ARFTG ConI, Tempe, AZ, pp. 46-50, Nov. 2007
8. A. Lewandowski, D. LeGolvan, R. A. Ginley, T. M. Wallis, A. Imtiaz, and P. Kabos, "Wideband measurement of extreme impedances with a multistate reflectometer," in Proc. 72nd ARFTG ConI, Portland, OR, pp. 45-49, Dec. 2008.