On resolution in electron tomography of beam sensitive materials

Journal of Physical Chemistry C

Volumn 118, Issue 2, 2014, Pages 1248-1257

  Chen, Delei ^a,b   Friedrich, Heiner ^a   With, Gijsbertus De ^a  

^a EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b DUTCH POLYMER INSTITUTE DPI   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

3D RECONSTRUCTION; ELECTRON TOMOGRAPHY; FUNCTIONAL NANOSTRUCTURES; MORPHOLOGICAL INFORMATION; ORGANIC SOLAR CELL; RECONSTRUCTION QUALITY; SENSITIVE MATERIALS; SPECIMEN GEOMETRY;

ELECTRIC IMPEDANCE TOMOGRAPHY; MERGERS AND ACQUISITIONS; THREE DIMENSIONAL;

INTERFACES (MATERIALS);

EID: 84892772002     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp409185u     Document Type: Article

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