Enhanced memory reliability against multiple cell upsets using decimal matrix code

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Volumn 22, Issue 1, 2014, Pages 127-135

  Guo, Jing ^a   Xiao, Liyi ^a   Mao, Zhigang ^a   Zhao, Qiang ^a  

^a HARBIN INSTITUTE OF TECHNOLOGY   (China)

Author keywords

Decimal algorithm; error correction codes (ECCs); mean time to failure (MTTF); memory; multiple cells upsets (MCUs)

Indexed keywords

DETECTION CAPABILITY; ENCODING AND DECODING; ERROR CORRECTION CAPABILITY; ERROR CORRECTION CODES; ERROR CORRECTION CODES (ECCS); MEAN TIME TO FAILURE; MULTIPLE CELLS; RADIATION ENVIRONMENTS;

ALGORITHMS; DATA STORAGE EQUIPMENT; ERROR CORRECTION;

RELIABILITY;

EID: 84891836733     PISSN: 10638210     EISSN: None     Source Type: Journal    
DOI: 10.1109/TVLSI.2013.2238565     Document Type: Article

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