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Volumn 12, Issue 1, 2012, Pages 101-106

A (64,45) triple error correction code for memory applications

Author keywords

Difference set codes; error correction codes (ECCs); majority logic decoding; memory

Indexed keywords

DATA CORRUPTION; DECODABLE CODES; DIFFERENCE-SET CODES; ERROR CORRECTION CAPABILITY; ERROR CORRECTION CODES; ERROR CORRECTION CODES (ECCS); LOW LATENCY; LOW-COMPLEXITY; MAJORITY LOGIC DECODING; MEMORY APPLICATIONS; MEMORY DESIGN; MEMORY PROTECTION; MODERATE COMPLEXITY; SOFT ERROR; WORD LENGTH;

EID: 84858141999     PISSN: 15304388     EISSN: 15582574     Source Type: Journal    
DOI: 10.1109/TDMR.2011.2169413     Document Type: Article
Times cited : (22)

References (25)
  • 1
    • 29344472607 scopus 로고    scopus 로고
    • Radiation-induced soft errors in advanced semiconductor technologies
    • Sep.
    • R. C. Baumann, "Radiation-induced soft errors in advanced semiconductor technologies," IEEE Trans. Device Mater. Reliab., vol. 5, no. 3, pp. 305-316, Sep. 2005.
    • (2005) IEEE Trans. Device Mater. Reliab. , vol.5 , Issue.3 , pp. 305-316
    • Baumann, R.C.1
  • 2
    • 0021392066 scopus 로고
    • Error-correcting codes for semiconductor memory applications: A state-of-the-art review
    • Mar.
    • C. L. Chen and M. Y. Hsiao, "Error-correcting codes for semiconductor memory applications: A state-of-the-art review," IBM J. Res. Develop., vol. 28, no. 2, pp. 124-134, Mar. 1984.
    • (1984) IBM J. Res. Develop. , vol.28 , Issue.2 , pp. 124-134
    • Chen, C.L.1    Hsiao, M.Y.2
  • 3
    • 0025419560 scopus 로고
    • Reliability of scrubbing recovery-techniques for memory systems
    • Apr.
    • A. M. Saleh, J. J. Serrano, and J. H. Patel, "Reliability of scrubbing recovery-techniques for memory systems," IEEE Trans. Reliab., vol. 39, no. 1, pp. 114-122, Apr. 1990.
    • (1990) IEEE Trans. Reliab. , vol.39 , Issue.1 , pp. 114-122
    • Saleh, A.M.1    Serrano, J.J.2    Patel, J.H.3
  • 4
    • 77954030094 scopus 로고    scopus 로고
    • Impact of scaling on neutron-induced soft error in SRAMs from a 250 nm to a 22 nm design rule
    • Jul.
    • E. Ibe, H. Taniguchi, Y. Yahagi, K. Shimbo, and T. Toba, "Impact of scaling on neutron-induced soft error in SRAMs from a 250 nm to a 22 nm design rule," IEEE Trans. Electron Devices, vol. 57, no. 7, pp. 1527-1538, Jul. 2010.
    • (2010) IEEE Trans. Electron Devices , vol.57 , Issue.7 , pp. 1527-1538
    • Ibe, E.1    Taniguchi, H.2    Yahagi, Y.3    Shimbo, K.4    Toba, T.5
  • 5
    • 58849088491 scopus 로고    scopus 로고
    • Single event effect induced multiple-cell upsets in a commercial 90 nm CMOS digital technology
    • Dec.
    • R. K. Lawrence and A. T Kelly, "Single event effect induced multiple-cell upsets in a commercial 90 nm CMOS digital technology," IEEE Trans. Nucl. Sci., vol. 55, pt. 1, no. 6, pp. 3367-3374, Dec. 2008.
    • (2008) IEEE Trans. Nucl. Sci. , vol.55 , Issue.6 PART. 1 , pp. 3367-3374
    • Lawrence, R.K.1    Kelly, A.T.2
  • 6
    • 0033737766 scopus 로고    scopus 로고
    • Geometric effect of multiple-bit soft errors induced by cosmic ray neutrons on DRAMs
    • Jun.
    • S. Satoh, Y. Tosaka, and S. A. Wender, "Geometric effect of multiple-bit soft errors induced by cosmic ray neutrons on DRAMs," IEEE Electron Device Lett., vol. 21, no. 6, pp. 310-312, Jun. 2000.
    • (2000) IEEE Electron Device Lett. , vol.21 , Issue.6 , pp. 310-312
    • Satoh, S.1    Tosaka, Y.2    Wender, S.A.3
  • 7
    • 69549118775 scopus 로고    scopus 로고
    • SRAM interleaving distance selection with a soft error failure model
    • Aug.
    • S. Baeg, S. Wen, and R. Wong, "SRAM interleaving distance selection with a soft error failure model," IEEE Trans. Nucl. Sci., vol. 56, pt. 2, no. 4, pp. 2111-2118, Aug. 2009.
    • (2009) IEEE Trans. Nucl. Sci. , vol.56 , Issue.4 PART. 2 , pp. 2111-2118
    • Baeg, S.1    Wen, S.2    Wong, R.3
  • 8
    • 37549069366 scopus 로고    scopus 로고
    • Multiple bit upset tolerant memory using a selective cycle avoidance based SEC-DED-DAEC code
    • A. Dutta and N. A. Touba, "Multiple bit upset tolerant memory using a selective cycle avoidance based SEC-DED-DAEC code," in Proc. 25th IEEE VLSI Test Symp., 2007, pp. 349-354.
    • (2007) Proc. 25th IEEE VLSI Test Symp. , pp. 349-354
    • Dutta, A.1    Touba, N.A.2
  • 9
    • 39049144737 scopus 로고    scopus 로고
    • A soft-error tolerant contentaddressable memory (CAM) using an error-correcting-match scheme
    • Sep. 10-13
    • K. Pagiamtzis, N. Azizi, and F. N. Najm, "A soft-error tolerant contentaddressable memory (CAM) using an error-correcting-match scheme," in Proc. IEEE Custom Integr. Circuits Conf., Sep. 10-13, 2006, pp. 301-304.
    • (2006) Proc. IEEE Custom Integr. Circuits Conf. , pp. 301-304
    • Pagiamtzis, K.1    Azizi, N.2    Najm, F.N.3
  • 11
    • 57849169110 scopus 로고    scopus 로고
    • DEC ECC design to improve memory reliability in Sub-100nm technologies
    • R. Naseer and J. Draper, "DEC ECC design to improve memory reliability in Sub-100nm technologies," in Proc. IEEE ICECS, 2008, pp. 586-589.
    • (2008) Proc. IEEE ICECS , pp. 586-589
    • Naseer, R.1    Draper, J.2
  • 12
    • 77949390552 scopus 로고    scopus 로고
    • Multi-bit error correction methods for latency-constrained flash memory systems
    • Mar.
    • P. Ankolekar, S. Rosner, R. Isaac, and J. Bredow, "Multi-bit error correction methods for latency-constrained flash memory systems," IEEE Trans. Device Mater. Rel., vol. 10, no. 1, pp. 33-39, Mar. 2010.
    • (2010) IEEE Trans. Device Mater. Rel. , vol.10 , Issue.1 , pp. 33-39
    • Ankolekar, P.1    Rosner, S.2    Isaac, R.3    Bredow, J.4
  • 13
    • 80052098710 scopus 로고    scopus 로고
    • Low-density parity check codes for error correction in nanoscale memory
    • Menlo Park, CA, Tech. Rep., CSL-0703
    • S. Ghosh and P. D. Lincoln, "Low-density parity check codes for error correction in nanoscale memory," Comput. Sci. Lab., SRI Int., Menlo Park, CA, Tech. Rep., CSL-0703, 2007.
    • (2007) Comput. Sci. Lab., SRI Int.
    • Ghosh, S.1    Lincoln, P.D.2
  • 14
    • 62949103821 scopus 로고    scopus 로고
    • Fault secure encoder and decoder for nanomemory applications
    • Apr.
    • H. Naeimi and A. DeHon, "Fault secure encoder and decoder for nanomemory applications," IEEE Trans. Very Large Scale Integr. (VLSI) Syst., vol. 17, no. 4, pp. 473-486, Apr. 2009.
    • (2009) IEEE Trans. Very Large Scale Integr. (VLSI) Syst. , vol.17 , Issue.4 , pp. 473-486
    • Naeimi, H.1    DeHon, A.2
  • 16
    • 84858145531 scopus 로고    scopus 로고
    • Efficient majority logic fault detection with difference-set codes for memory applications
    • to be published
    • S. Liu, P. Reviriego, and J. A. Maestro, "Efficient majority logic fault detection with difference-set codes for memory applications," IEEE Trans. Very Large Scale Integr. (VLSI) Syst., 2010, to be published.
    • (2010) IEEE Trans. Very Large Scale Integr. (VLSI) Syst.
    • Liu, S.1    Reviriego, P.2    Maestro, J.A.3
  • 18
    • 84934298492 scopus 로고
    • Difference-set cyclic codes
    • E. J.Weldon, Jr., "Difference-set cyclic codes," Bell Syst. Tech. J., vol. 45, pp. 1045-1055, 1966.
    • (1966) Bell Syst. Tech. J. , vol.45 , pp. 1045-1055
    • Weldon Jr., E.J.1
  • 19
    • 0002669842 scopus 로고
    • Application of Boolean algebra to switching circuit design and to error detection
    • D. E. Muller, "Application of Boolean algebra to switching circuit design and to error detection," IRE Trans. Electron. Comput., vol. 3, pp. 6-12, 1954.
    • (1954) IRE Trans. Electron. Comput. , vol.3 , pp. 6-12
    • Muller, D.E.1
  • 20
    • 9144245836 scopus 로고
    • A class of multiple-error-correcting codes and the decoding scheme
    • Sep.
    • I. S. Reed, "A class of multiple-error-correcting codes and the decoding scheme," IRE Trans. Inf. Theory, vol. IT-4, no. 4, pp. 38-49, Sep. 1954.
    • (1954) IRE Trans. Inf. Theory , vol.IT-4 , Issue.4 , pp. 38-49
    • Reed, I.S.1
  • 21
    • 0014823837 scopus 로고
    • A class of optimal minimum odd-weight column SEC-DED codes
    • Jul.
    • M. Y. Hsiao, "A class of optimal minimum odd-weight column SEC-DED codes," IBM J. Res. Develop., vol. 14, no. 4, pp. 395-401, Jul. 1970.
    • (1970) IBM J. Res. Develop. , vol.14 , Issue.4 , pp. 395-401
    • Hsiao, M.Y.1
  • 22
    • 52049098657 scopus 로고    scopus 로고
    • New linear SEC-DED codes with reduced triple bit error miscorrection probability
    • Jul.
    • M. Richter, K. Oberlaender, and M. Goessel, "New linear SEC-DED codes with reduced triple bit error miscorrection probability," in Proc. IEEE Int. On-Line Testing Symp., Jul. 2008, pp. 37-42.
    • (2008) Proc. IEEE Int. On-Line Testing Symp. , pp. 37-42
    • Richter, M.1    Oberlaender, K.2    Goessel, M.3
  • 23
    • 51049099146 scopus 로고    scopus 로고
    • Improved decoding algorithm for high reliable reed muller coding
    • Hsinchu, Taiwan, Sep. 26-29
    • C. Argyrides and D. K. Pradhan, "Improved decoding algorithm for high reliable reed muller coding," in Proc. IEEE Int. SOCC, Hsinchu, Taiwan, Sep. 26-29, 2007, pp. 95-98.
    • (2007) Proc. IEEE Int. SOCC , pp. 95-98
    • Argyrides, C.1    Pradhan, D.K.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.