Minimizing soft errors in TCAM devices: A probabilistic approach to determining scrubbing intervals

IEEE Transactions on Circuits and Systems I: Regular Papers

Volumn 57, Issue 4, 2010, Pages 814-822

  Baeg, Sanghyeon ^a   Wen, Shijie ^b   Wong, Richard ^b  

^a Hanyang University   (South Korea)

^b CISCO SYSTEMS   (United States)

Author keywords

MCU; Scrubbing Interval; Soft error; TCAM

Indexed keywords

CMOS TECHNOLOGY; COMPOUND POISSON; DESIGN SCHEME; DEVICE PERFORMANCE; FAILURE PROBABILITY; MEMORY CELL; MODEL BASED APPROACH; MULTICELL; OPERATING VOLTAGE RANGE; PROBABILISTIC APPROACHES; PROBABILISTIC FAILURE; SINGLE-BIT; SOFT ERROR; STATIC RANDOM ACCESS MEMORY; STRUCTURAL COUPLING; TERNARY CONTENT ADDRESSABLE MEMORIES; TEST DATA; TEST RESULTS; WORST CASE; WORST-CASE ANALYSIS;

CMOS INTEGRATED CIRCUITS; FAILURE ANALYSIS; LOGIC GATES; MICROPROCESSOR CHIPS; QUALITY ASSURANCE; RANDOM ACCESS STORAGE; RANDOM ERRORS; TEST FACILITIES;

ERROR CORRECTION;

EID: 77951025056     PISSN: 15498328     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCSI.2009.2025856     Document Type: Article

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