Finger probe array for topography-tolerant scanning electrochemical microscopy of extended samples

Analytical Chemistry

Volumn 86, Issue 1, 2014, Pages 713-720

  Lesch, Andreas ^a,b   Chen, Po Chung ^a,c   Roelfs, Folkert ^a   Dosche, Carsten ^a   Momotenko, Dmitry ^b   Cortés Salazar, Fernando ^b   Girault, Hubert H ^b   Wittstock, Gunther ^a  

^a UNIVERSITY OF OLDENBURG   (Germany)

^b EPFL   (Switzerland)

^c NATIONAL CENTRAL UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

EXTENDED SAMPLES; FINGER PROBES; INSULATING GLASS; MAGNETIC FORCE; MICROELECTRODE ARRAY; SAMPLE SURFACE; SCANNING ELECTROCHEMICAL MICROSCOPY; WORKING DISTANCES;

PROBES; SCANNING ELECTRON MICROSCOPY; SCANNING PROBE MICROSCOPY; SURFACE TOPOGRAPHY;

MICROELECTRODES;

ARTICLE; EQUIPMENT; METHODOLOGY; MICROELECTRODE; SCANNING ELECTROCHEMICAL MICROSCOPY;

MICROELECTRODES; MICROSCOPY, ELECTROCHEMICAL, SCANNING;

EID: 84891773205     PISSN: 00032700     EISSN: 15206882     Source Type: Journal    
DOI: 10.1021/ac403168p     Document Type: Article

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