High-throughput scanning electrochemical microscopy brushing of strongly tilted and curved surfaces

Electrochimica Acta

Volumn 110, Issue , 2013, Pages 30-41

  Lesch, Andreas ^a,b   Momotenko, Dmitry ^b   Cortés Salazar, Fernando ^b   Roelfs, Folkert ^a   Girault, Hubert H ^b   Wittstock, Gunther ^a  

^a UNIVERSITY OF OLDENBURG   (Germany)

^b EPFL   (Switzerland)

Author keywords

Contact mode scanning; Scanning electrochemical microscopy; Soft linear microelectrode arrays; Strongly curved substrates; Strongly tilted substrates

Indexed keywords

CONTACT MODES; CURVED SUBSTRATES; MICROELECTRODE ARRAY; SCANNING ELECTROCHEMICAL MICROSCOPY; TILTED SUBSTRATE;

MICROELECTRODES; PROBES; SCANNING ELECTRON MICROSCOPY; SCANNING PROBE MICROSCOPY; THROUGHPUT;

SUBSTRATES;

EID: 84888298895     PISSN: 00134686     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.electacta.2013.03.101     Document Type: Article

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