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Technical Physics Letters

Volumn 39, Issue 12, 2013, Pages 1097-1100

Depth profiling of fullerene-containing structures by time-of-flight secondary ion mass spectrometry

(6) Drozdov, M N a,b Drozdov, Yu N a,b Pakhomov, G L a,b Travkin, V V a,b Yunin, P A a,b Razumov, V F a,b

a INSTITUTE FOR PHYSICS OF MICROSTRUCTURES (Russian Federation)

b INSTITUTE OF PROBLEMS OF CHEMICAL PHYSICS (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84891286638 PISSN: 10637850 EISSN: None Source Type: Journal
DOI: 10.1134/S1063785013120183 Document Type: Article

Times cited : (7)

References (17)

1
- 78650708928
- J. S. Fletcher, N. P. Lockyer, and J. C. Vickerman, Mass Spectrom. Rev. 30, 142 (2011).
- (2011) Mass Spectrom. Rev. , vol.30 , pp. 142
- Fletcher, J.S.¹ Lockyer, N.P.² Vickerman, J.C.³

2
- 78951494724
- D. Rading, R. Moellers, F. Kollmer, W. Paul, and E. Niehuis, Surf. Interface Anal. 43, 198 (2011).
- (2011) Surf. Interface Anal. , vol.43 , pp. 198
- Rading, D.¹ Moellers, R.² Kollmer, F.³ Paul, W.⁴ Niehuis, E.⁵

3
- 84872866223
- N. Vinograd, Surf. Interface Anal. 45, 3 (2013).
- (2013) Surf. Interface Anal. , vol.45 , pp. 3
- Vinograd, N.¹

4
- 5844306503
- K. Iltgen, C. Bendel, A. Benninghoven, and E. Niehuis, J. Vac. Sci. Technol. A 15, 460 (1997).
- (1997) J. Vac. Sci. Technol. A , vol.15 , pp. 460
- Iltgen, K.¹ Bendel, C.² Benninghoven, A.³ Niehuis, E.⁴

5
- 0009813642
- L. van Vaeck, A. Adriaens, and R. Gijbels, Mass Spectrom. Rev. 18, 1 (1999).
- (1999) Mass Spectrom. Rev. , vol.18 , pp. 1
- Vaeck, L.V.¹ Adriaens, A.² Gijbels, R.³

6
- 56449115157
- H.-G. Cramer, T. Grehl, F. Kollmer, R. Moellers, E. Niehuis, and D. Rading, Appl. Surf. Sci. 255, 966 (2008).
- (2008) Appl. Surf. Sci. , vol.255 , pp. 966
- Cramer, H.-G.¹ Grehl, T.² Kollmer, F.³ Moellers, R.⁴ Niehuis, E.⁵ Rading, D.⁶

7
- 56449124172
- L. Houssiau, B. Douhard, and N. Mine, Appl. Surf. Sci. 255, 970 (2008).
- (2008) Appl. Surf. Sci. , vol.255 , pp. 970
- Houssiau, L.¹ Douhard, B.² Mine, N.³

8
- 78951495003
- K. Q. Ngo, P. Philipp, Y. Jin, S. E. Morris, M. Shtein, J. Kieffer, and T. Wirts, Surf. Interface Anal. 43, 194 (2011).
- (2011) Surf. Interface Anal. , vol.43 , pp. 194
- Ngo, K.Q.¹ Philipp, P.² Jin, Y.³ Morris, S.E.⁴ Shtein, M.⁵ Kieffer, J.⁶ Wirts, T.⁷

9
- 78951485024
- M. Py, J. P. Barnes, M. Charbonneau, and R. Tiron, J. Buckley, Surf. Interface Anal. 43, 179 (2011).
- (2011) J. Buckley, Surf. Interface Anal. , vol.43 , pp. 179
- Py, M.¹ Barnes, J.P.² Charbonneau, M.³ Tiron, R.⁴

10
- 84872856321
- D. Rading, R. Moellers, H.-G. Cramer, and E. Niehuis, Surf. Interface Anal. 45, 171 (2013).
- (2013) Surf. Interface Anal. , vol.45 , pp. 171
- Rading, D.¹ Moellers, R.² Cramer, H.-G.³ Niehuis, E.⁴

11
- 84872874326
- T. Conard, A. Franquet, D. Tsvetanova, T. Mouhib, and W. Vandervorst, Surf. Inerface Anal 45, 406 (2013).
- (2013) Surf. Inerface Anal , vol.45 , pp. 406
- Conard, T.¹ Franquet, A.² Tsvetanova, D.³ Mouhib, T.⁴ Vandervorst, W.⁵

12
- 84872848606
- T. Mouhib, C. Poleunis, R. Mollers, E. Niehuis, P. Defrance, P. Bertrand, and A. Delcorte, Surf. Interface Anal. 45, 163 (2013).
- (2013) Surf. Interface Anal. , vol.45 , pp. 163
- Mouhib, T.¹ Poleunis, C.² Mollers, R.³ Niehuis, E.⁴ Defrance, P.⁵ Bertrand, P.⁶ Delcorte, A.⁷

13
- 84872854387
- H. L. Kotze, E. G. Armitage, J. S. Fletcher, A. Henderson, K. J. Williams, N. P. Lockyer, and J. C. Vickerman, Surf. Interface Anal. 45, 277 (2013).
- (2013) Surf. Interface Anal. , vol.45 , pp. 277
- Kotze, H.L.¹ Armitage, E.G.² Fletcher, J.S.³ Henderson, A.⁴ Williams, K.J.⁵ Lockyer, N.P.⁶ Vickerman, J.C.⁷

14
- 78650650688
- P. A. Troshin, R. N. Lyubovskaya, and V. F. Razumov, Nanotechnol. Russ. 3, 242 (2008).
- (2008) Nanotechnol. Russ. , vol.3 , pp. 242
- Troshin, P.A.¹ Lyubovskaya, R.N.² Razumov, V.F.³

15
- 84855948260
- S. Zeeshan, S. Javeed, and S. Ahmad, Intern. J. Mass Spectrom. 311, 1 (2012).
- (2012) Intern. J. Mass Spectrom. , vol.311 , pp. 1
- Zeeshan, S.¹ Javeed, S.² Ahmad, S.³

16
- 0004123519
- D. Li, Y. Chen, G. Wang, G. Shrivastav, S. Oak, A. Tasch, and S. Banerjee, User's Manual (University of Texas at Austin, 2000).
- (2000) User's Manual
- Li, D.¹ Chen, Y.² Wang, G.³ Shrivastav, G.⁴ Oak, S.⁵ Tasch, A.⁶ Banerjee, S.⁷

17
- 84891583495
- Cluster Secondary Ion Mass Spectrometry, Ed. by C. M. Mahoney (John Wiley & Sons, 2013).
- (2013) Cluster Secondary Ion Mass Spectrometry
- Mahoney, C.M.¹

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