SCOPUS 정보 검색 플랫폼

Surface and Interface Analysis

Volumn 43, Issue 1-2, 2011, Pages 179-182

Investigation of fullerene depth distribution in PMMA-C60 blends using dual beam ToF-SIMS

(5) Py, M a Barnes, J P a Charbonneau, M a Tiron, R a Buckley, J a

a CEA GRENOBLE (France)

Author keywords

C60; depth profile; dual beam ToF SIMS; organic electronics; PMMA

Indexed keywords

C60; DEPTH PROFILE; DUAL BEAM; ORGANIC ELECTRONICS; PMMA;

CESIUM; CONTACT ANGLE; FULLERENES; IONS; ISOTOPES; NANOCOMPOSITES; OPTOELECTRONIC DEVICES; POLYMER BLENDS; SECONDARY ION MASS SPECTROMETRY; SEMICONDUCTING SILICON COMPOUNDS; SILICON WAFERS;

DEPTH PROFILING;

EID: 78951485024 PISSN: 01422421 EISSN: 10969918 Source Type: Journal
DOI: 10.1002/sia.3534 Document Type: Conference Paper

Times cited : (9)

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