Organic depth profiling of C60 and C60/phthalocyanine layers using argon clusters

Surface and Interface Analysis

Volumn 45, Issue 1, 2013, Pages 163-166

  Mouhib, T ^a,b   Poleunis, C ^a   Mollers R ^c   Niehuis, E ^c   Defrance, P ^a   Bertrand, P ^a   Delcorte, A ^a  

^a UNIVERSITÉ CATHOLIQUE DE LOUVAIN   (Belgium)

^b HASSAN 1ST UNIVERSITY   (Morocco)

^c UNIVERSITY OF MÜNSTER   (Germany)

Author keywords

C60; large argon clusters; organic depth profiling; phthalocyanine

Indexed keywords

ANALYSIS CONDITIONS; ARGON CLUSTERS; BI-LAYER; C60; CLUSTER ENERGY; CLUSTER PROJECTILES; FLEXIBLE SUBSTRATE; INTERFACIAL PROPERTY; LINEAR RELATIONSHIPS; MOLECULAR DEPTH PROFILING; MOLECULAR SEMICONDUCTORS; ORGANIC DEPTH PROFILING; PHTHALOCYANINE; ROOM TEMPERATURE; SILICON SUBSTRATES; SPUTTER IONS; TIN-PHTHALOCYANINE; TOTAL ENERGY;

FULLERENES; HETEROJUNCTIONS; LIGHT EMITTING DIODES; NITROGEN COMPOUNDS; PHOTOVOLTAIC CELLS; PROJECTILES; TIN;

DEPTH PROFILING;

EID: 84872848606     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.5052     Document Type: Conference Paper

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