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Surface and Interface Analysis

Volumn 43, Issue 1-2, 2011, Pages 194-197

Analysis of organic multilayered samples for optoelectronic devices by (low-energy) dynamic SIMS

(7) Ngo, K Q a Philipp, P a Jin, Y b Morris, S E b Shtein, M b Kieffer, J b Wirtz, T a

a LUXEMBOURG INSTITUTE OF SCIENCE AND TECHNOLOGY (Luxembourg)

b UNIVERSITY OF MICHIGAN (United States)

Author keywords

depth profile; low impact energy; organic multilayer; SIMS; sputtering

Indexed keywords

ATOMIC MIXING; BURIED INTERFACE; CHARACTERIZATION TECHNIQUES; CURRENT PROJECTS; DEPTH PROFILE; DEVICE STRUCTURES; DIMENSIONAL CONTROL; DISTRIBUTION OF ELEMENT; DOPING STRATEGIES; DYNAMIC SIMS; ENERGY APPLICATIONS; EXPERIMENTAL CONDITIONS; IMPACT ENERGY; IONIZATION MECHANISMS; LOW ENERGIES; LOW IMPACT ENERGY; MOLECULAR LEVELS; MULTI-LAYERED; MULTI-LAYERED STRUCTURE; OPTOELECTRONIC MATERIALS; ORGANIC MULTILAYERS; ORGANIC PHOTOVOLTAIC CELLS; ORGANIC THIN FILMS; SECONDARY IONS; SIMS;

CESIUM; ELECTROOPTICAL DEVICES; EQUIPMENT; FATIGUE CRACK PROPAGATION; FILM PREPARATION; LIGHT EMITTING DIODES; MULTILAYERS; OPTOELECTRONIC DEVICES; PHOTOVOLTAIC CELLS; SCANDIUM;

ORGANIC LIGHT EMITTING DIODES (OLED);

EID: 78951495003 PISSN: 01422421 EISSN: 10969918 Source Type: Journal
DOI: 10.1002/sia.3451 Document Type: Conference Paper

Times cited : (5)

References (11)

1
- 19944414967
- S. E. Shaheen, D. S. Ginley, G. E. Jabbour, MRS bulletin 2005, 30, 10.
- (2005) MRS Bulletin , vol.30 , pp. 10
- Shaheen, S.E.¹ Ginley, D.S.² Jabbour, G.E.³

2
- 56449115157
- H. G. Cramer, T. Grehl, F. Kollmer, R. Moellers, E. Niehuis, D. Rading, Appl. Surf. Sci. 2008, 255, 966.
- (2008) Appl. Surf. Sci. , vol.255 , pp. 966
- Cramer, H.G.¹ Grehl, T.² Kollmer, F.³ Moellers, R.⁴ Niehuis, E.⁵ Rading, D.⁶

3
- 33645520288
- A. R. Chanbasha, A. T. S. Wee, J. Vac. Sci. Technol. B 2006, 24, 547.
- (2006) J. Vac. Sci. Technol. B , vol.24 , pp. 547
- Chanbasha, A.R.¹ Wee, A.T.S.²

4
- 78951488859
- K. Q. Ngo, P. Philipp, M. Shtein, J. Kieffer, T. Wirtz, Surf. Interface Anal. 2009.
- (2009) Surf. Interface Anal.
- Ngo, K.Q.¹ Philipp, P.² Shtein, M.³ Kieffer, J.⁴ Wirtz, T.⁵

5
- 78951495682
- E. D. Chambost, B. Boyer, B. Rasser, M. Schuhmacher, Proceeding of the twelveInternational Conference on Secondary Ion Mass Spectrometry (SIMS XII) 1999, 533.
- (1999) Proceeding of the TwelveInternational Conference on Secondary Ion Mass Spectrometry (SIMS XII) , vol.533
- Chambost, E.D.¹ Boyer, B.² Rasser, B.³ Schuhmacher, M.⁴

6
- 0035121357
- H. Gnaser, Phys. Rev. B 2001, 63, 45415.
- (2001) Phys. Rev. B , vol.63 , pp. 45415
- Gnaser, H.¹

7
- 0037438251
- H. Gnaser, Appl. Surf. Sci. 2003, 203, 78.
- (2003) Appl. Surf. Sci. , vol.203 , pp. 78
- Gnaser, H.¹

8
- 0036570019
- N. Toyoda, J. Matsuo, T. Aoki, I. Yamada, D. B. Fenner, Nucl. Instrum. Methods Phys. Res. B 2002, 190, 860.
- (2002) Nucl. Instrum. Methods Phys. Res. B , vol.190 , pp. 860
- Toyoda, N.¹ Matsuo, J.² Aoki, T.³ Yamada, I.⁴ Fenner, D.B.⁵

9
- 78951471063
- A. Delcorte, P. Bertrand, J. C. Vickerman, B. J. Garrison, Proceeding of the twelveInternational Conference on Secondary Ion Mass Spectrometry (SIMS XII) 1999, 27.
- (1999) Proceeding of the TwelveInternational Conference on Secondary Ion Mass Spectrometry (SIMS XII) , vol.27
- Delcorte, A.¹ Bertrand, P.² Vickerman, J.C.³ Garrison, B.J.⁴

10
- 0038464060
- A. K. Gupta, P. Ayyub, Eur. Phys. J. D 2001, 17, 221.
- (2001) Eur. Phys. J. D , vol.17 , pp. 221
- Gupta, A.K.¹ Ayyub, P.²

11
- 34547698808
- H. R. Wu, Q. L. Song, M. L. Wang, F. Y. Li, H. Yang, Y. Wu, C. H. Huang, X. M. Ding, X. Y. Hou, Thin Solid Films 2007, 515, 8050.
- (2007) Thin Solid Films , vol.515 , pp. 8050
- Wu, H.R.¹ Song, Q.L.² Wang, M.L.³ Li, F.Y.⁴ Yang, H.⁵ Wu, Y.⁶ Huang, C.H.⁷ Ding, X.M.⁸ Hou, X.Y.⁹

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