Novel mixed codes for multiple-cell upsets mitigation in static RAMs

IEEE Micro

Volumn 33, Issue 6, 2013, Pages 66-74

  Guo, Jing ^a   Xiao, Liyi ^a   Mao, Zhigang ^a   Zhao, Qiang ^a  

^a HARBIN INSTITUTE OF TECHNOLOGY   (China)

Author keywords

Doubly transitive invariant code; Error correcting code; Multiple cell upsets; Static RAM

Indexed keywords

APPLICATION EXAMPLES; DOUBLY TRANSITIVE; ENCODING AND DECODING; ERROR CORRECTING CODE; MULTIPLE-CELL UPSETS; PARTICLE RADIATION; SRAM RELIABILITIES; STATIC RAMS;

DECODING; RADIATION HARDENING; STATIC RANDOM ACCESS STORAGE;

ERROR CORRECTION;

EID: 84890937798     PISSN: 02721732     EISSN: None     Source Type: Journal    
DOI: 10.1109/MM.2013.125     Document Type: Article

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