Large-scale multiple cell upsets in 90 nm commercial SRAMs during neutron irradiation

IEEE Transactions on Nuclear Science

Volumn 59, Issue 6, 2012, Pages 2824-2830

  Hands, Alex ^a   Morris, Paul ^a   Ryden, Keith ^a   Dyer, Clive ^a  

^a QINETIQ   (United Kingdom)

Author keywords

Multiple cell upsets; neutron beams; single event effects; SRAMs

Indexed keywords

CELLS; CYTOLOGY; NEUTRON BEAMS; NEUTRON IRRADIATION;

ACCELERATED TESTS; BIT-INTERLEAVING; MEMORY ARRAY; MULTIPLE BIT UPSET; MULTIPLE CELL UPSET; READ-CYCLE; SINGLE EVENT EFFECTS; SPALLATION NEUTRONS; SRAMS;

STATIC RANDOM ACCESS STORAGE;

EID: 84871381364     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2012.2217383     Document Type: Article

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