Enhanced detection of double and triple adjacent errors in hamming codes through selective bit placement

IEEE Transactions on Device and Materials Reliability

Volumn 12, Issue 2, 2012, Pages 357-362

  Sánchez Macián, Alfonso ^a   Reviriego, Pedro ^a   Maestro, Juan Antonio ^a  

^a UNIVERSIDAD ANTONIO DE NEBRIJA   (Spain)

Author keywords

Error correction codes (ECCs); Hamming codes; memory; multiple cell upsets (MCUs)

Indexed keywords

ERROR CORRECTION CODES; HAMMING CODE; MEMORY CELL; MEMORY DESIGN; MULTIPLE BITS; MULTIPLE CELL UPSET; RADIATION PARTICLES; SOFT ERROR;

DATA STORAGE EQUIPMENT; MAGNETIC MATERIALS; RELIABILITY;

ERROR DETECTION;

EID: 84861999807     PISSN: 15304388     EISSN: 15582574     Source Type: Journal    
DOI: 10.1109/TDMR.2012.2186965     Document Type: Article

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