Spatially resolved electrical characterisation of graphene layers by an evanescent field microwave microscope

Physica E: Low-Dimensional Systems and Nanostructures

Volumn 56, Issue , 2014, Pages 431-434

  Gregory, Andrew ^a   Hao, Ling ^a   Klein, Norbert ^b   Gallop, John ^a   Mattevi, Cecilia ^b   Shaforost, Olena ^b   Lees, Kevin ^a   Clarke, Bob ^a  

^a NATIONAL PHYSICAL LABORATORY   (United Kingdom)

^b IMPERIAL COLLEGE LONDON   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

COMPLEX PERMITTIVITY; ELECTRICAL CHARACTERISATION; MICROWAVE MICROSCOPES; MICROWAVE SCANNING; MULTIPLE APPLICATIONS; NATIONAL PHYSICAL LABORATORY; RE-ENTRANT CAVITIES; SPATIALLY RESOLVED;

DIELECTRIC MATERIALS; EVANESCENT FIELDS; GRAPHENE; LABORATORIES; MICROWAVES; PROBES;

MICROSCOPES;

EID: 84890562245     PISSN: 13869477     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physe.2012.10.006     Document Type: Article

References (25)

1. C. Gao, and X.-D. Xiang Review of Scientific Instruments 69 1998 3846
2. H.-F. Cheng, Yi-Chun Chen, and I-Nan Lin Journal of the European Ceramic Society 26 2006 1801
3. J. Kim, M.-S. Kim, K. Lee, J. Lee, D. Cha, and B. Friedman Measurement Science and Technology 14 2003 7
4. D.E. Steinhauer, C.P. Vlahacos, F.C. Wellstood, S.M. Anlage, C. Canedy, and R. Ramesh Review of Scientific Instruments 71 7 2000 2751
5. N. Okazaki, H. Odagawa, Y. Cho, T. Nagamura, D. Komiyama, T. Koida, H. Minami, P. Ahmet, T. Fukumura, Y. Matsumoto, M. Kawasaki, T. Chikyow, H. Koinuma, and T. Hasegawa Applied Surface Science 189 3 2002 222
6. V.V. Talanov, A. Scherz, R.L. Moreland, and A.R. Schwartz Applied Physics Letters 88 2006 134106
7. J. Kim, K. Lee, B. Friedman, and D. Cha Applied Physics Letters 83 5 2003 1032
8. R.A. Potyrailo, and I. Takeuchi Measurement Science and Technology 16 1 2005 1
9. D.-Y. Sheu, and J. Micromech. Microeng 15 1 2005 185
10. Software: CST Microwave Studio. 〈http://www.cst. comâŒ
11. M.S. Kim, S. Kim, J. Kim, K. Lee, B. Friedman, J.-T. Kim, and J. Lee Review of Scientific Instruments 74 8 2003 3675
12. Y. Seo, and S. Hong Modern Physics Letters B 26 2005 1302
13. A.G.T. Ruiter, J.A. Veerman, K.O. van der Werf, and N.F. van Hulst Applied Physics Letters 71 1 1997 28
14. W.A. Atia, and C.C. Davis Applied Physics Letters 70 4 1997 405
15. S. Hoppe, G. Ctistis, J.J. Paggel, and P. Fumagalli Ultramicroscopy 102 2005 221
16. K.S. Novoselov, A.K. Geim, S.V. Morozov, D. Jiang, Y. Zhang, S.V. Dubonos, I.V. Grigorieva, and A.A. Firsov Science 306 2004 666
17. A.H. Castro Neto, F. Guinea, N.M.R. Peres, K.S. Novoselov, and A.K. Geim Reviews of Modern Physics 81 2009 109
18. K.S. Novoselov, A.K. Geim, S.V. Morozov, D. Jiang, M.I. Katsnelson, I.V. Grigorieva, S.V. Dubonos, and A.A. Firsov Nature (London) 438 2005 197
19. Y. Zhang, Y.W. Tan, H.L. Stormer, and P. Kim Nature (London) 438 2005 201
20. Keji Worasom Kundhikanjana, Hailiang Lai, Hongjie Wang, Michael A. Dai, Kelly, and Zhi-xun Shen Nano Letters 9 2009 3762
21. V.V. Talanov, C. Del Barga, L. Wickey, I. Kalichava, E. Gonzales, E.A. Shaner, A.V. Gin, and N.G. Kalugin American Chemical Society Nano 4 2010 3831
22. G. Eda, G. Fanchini, and M. Chhowalla Nature Nanotechnology 3 2008 270
23. C. Mattevi, G. Eda, S. Agnoli, S. Miller, K.A. Mkhoyan, O. Celik, D. Mastrogiovanni, G. Granozzi, E. Garfunkel, and M. Chhowalla Advanced Functional Materials 19 2009 2577
24. H. Kim, C. Mattevi, M.R. Calvo, J.C. Oberg, L. Artiglia, S. Agnoli, C.F. Hirjibehedin, M. Chhowalla, and E. Saiz American Chemical Society Nano 6 4 2012 3614
25. L. Hao, C. Mattevi, J. Gallop, S. Goniszewski, Y. Xiao, L. Cohen, and N. Klein Nanotechnology 23 2012 285706