Spectroscopy of the shear force interaction in scanning near-field optical microscopy

Ultramicroscopy

Volumn 102, Issue 3, 2005, Pages 221-226

  Hoppe, Stefan ^a   Ctistis, Georgios ^a   Paggel, Jens J ^a   Fumagalli, Paul ^a  

^a FREIE UNIVERSITÄT BERLIN   (Germany)

Author keywords

Near field optical microscopy (NFOM)

Indexed keywords

DAMPING CONSTANTS; HARMONIC OSCILLATOR; SHEAR FORCE DETECTION;

DAMPING; HARMONIC GENERATION; OSCILLATIONS; SCANNING; SUBSTRATES;

OPTICAL MICROSCOPY;

ARTICLE; FORCE; MATHEMATICAL ANALYSIS; MOLECULAR INTERACTION; OSCILLATION; SCANNING NEAR FIELD OPTICAL MICROSCOPY; SPECTROSCOPY; THEORETICAL MODEL;

MICROSCOPY, ATOMIC FORCE; MODELS, THEORETICAL; SPECTRUM ANALYSIS; STRESS, MECHANICAL; VIBRATION;

EID: 11444268309     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2004.10.002     Document Type: Article

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