SCOPUS 정보 검색 플랫폼

Journal of the European Ceramic Society

Volumn 26, Issue 10-11, 2006, Pages 1801-1805

Evanescent microwave probe study on dielectric properties of materials

(3) Cheng, Hsiu Fung a Chen, Yi Chun b Lin, I Nan c

a NATIONAL TAIWAN NORMAL UNIVERSITY (Taiwan)

b NATIONAL CHENG KUNG UNIVERSITY (Taiwan)

c TAMKANG UNIVERSITY (Taiwan)

Author keywords

Dielectric properties; Evanescent microwave microscopy; Impurities; Surfaces

Indexed keywords

CAVITY RESONATORS; CHEMICAL ANALYSIS; COMPUTER SIMULATION; DIELECTRIC LOSSES; DIELECTRIC PROPERTIES OF SOLIDS; ELECTROMAGNETIC FIELDS; FINITE ELEMENT METHOD; IMPURITIES;

CONDUCTOR LOSSES; EVANESCENT MICROWAVE MICROSCOPY;

CERAMIC MATERIALS;

CAVITY RESONATORS; CERAMIC MATERIALS; CHEMICAL ANALYSIS; COMPUTER SIMULATION; DIELECTRIC LOSSES; DIELECTRIC PROPERTIES OF SOLIDS; ELECTROMAGNETIC FIELDS; FINITE ELEMENT METHOD; IMPURITIES;

EID: 33645539365 PISSN: 09552219 EISSN: None Source Type: Journal
DOI: 10.1016/j.jeurceramsoc.2005.09.034 Document Type: Conference Paper

Times cited : (12)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.